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Volumn 5501, Issue , 2004, Pages 357-365

X-ray CCD with charge injection structure

Author keywords

Charge coupled device; Charge injection; Electron traps; kTC noise; X ray

Indexed keywords

CHARGE INJECTION; CHARGE-VOLUME RATIO; PIECEWISE-LINEAR MODELS; SIGNAL CHARGE PACKETS;

EID: 10844222471     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.553059     Document Type: Conference Paper
Times cited : (19)

References (11)
  • 5
    • 0036541302 scopus 로고    scopus 로고
    • Modeling the impact of preflushing on CTE in proton irradiated CCD-based detectors
    • R. Philbrick, "Modeling the impact of preflushing on CTE in proton irradiated CCD-based detectors," IEEE Transactions on Nuclear Science 49(2), pp. 559-567, 2002.
    • (2002) IEEE Transactions on Nuclear Science , vol.49 , Issue.2 , pp. 559-567
    • Philbrick, R.1
  • 6
    • 0016128631 scopus 로고
    • The effects of bulk traps on the performance of bulk channel charge-coupled devices
    • A. Mohsen and M. Tompsett, "The effects of bulk traps on the performance of bulk channel charge-coupled devices," IEEE Transactions on Nuclear Science ED-21(11), pp. 701-712, 1974.
    • (1974) IEEE Transactions on Nuclear Science , vol.ED-21 , Issue.11 , pp. 701-712
    • Mohsen, A.1    Tompsett, M.2
  • 9
    • 0035111662 scopus 로고    scopus 로고
    • Analysis of temporal noise in CMOS photodiode active pixel sensor
    • H. Tian, B. Fowler, and A. Gamal, "Analysis of temporal noise in CMOS photodiode Active Pixel Sensor.," IEEE Journal of Solid-State Circuits 36(1), pp. 92-101, 2001.
    • (2001) IEEE Journal of Solid-state Circuits , vol.36 , Issue.1 , pp. 92-101
    • Tian, H.1    Fowler, B.2    Gamal, A.3
  • 11
    • 0016352732 scopus 로고
    • Noise measurement on the floating diffusion input for charge-coupled devices
    • S. Emmons and D. Buss, "Noise measurement on the floating diffusion input for charge-coupled devices.," Journal of Applied Physics 45, pp. 5303-5306, 1974.
    • (1974) Journal of Applied Physics , vol.45 , pp. 5303-5306
    • Emmons, S.1    Buss, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.