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Volumn 13, Issue 12, 2003, Pages 508-510

Influence of the SRO as Passivation Layer on the Microwave Attenuation Losses of the CPWs Fabricated on HR-Si

Author keywords

Attenuation loss; Coplanar wave guides (CPW); Matrix wave propagation; Passivation layer transmission; Silicon rich oxide (SRO)

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTROMAGNETIC WAVE ATTENUATION; ELECTROMAGNETIC WAVE PROPAGATION; ELECTROMAGNETIC WAVE REFLECTION; MATRIX ALGEBRA; MICROWAVES; PASSIVATION; PERMITTIVITY; SILICON COMPOUNDS; THERMOOXIDATION;

EID: 10744220669     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2003.819967     Document Type: Article
Times cited : (13)

References (9)
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    • Achar, R.1    Nakhla, M.S.2
  • 6
    • 0036066088 scopus 로고    scopus 로고
    • Substrate Loss Mechanisms for microstrip and CPW transmission lines in lossy silicon wafers
    • February
    • D. Lederer and J.-P. Raskin, "Substrate Loss Mechanisms for microstrip and CPW transmission lines in lossy silicon wafers," in IEEE MTT-S. Dig., vol. 8, February 1998, pp. 685-688.
    • (1998) IEEE MTT-S. Dig. , vol.8 , pp. 685-688
    • Lederer, D.1    Raskin, J.-P.2
  • 8
    • 19244380723 scopus 로고    scopus 로고
    • Unified method for determining the complex propagation constant of reflecting and nonreflecting transmission lines
    • Aug.
    • J. A. Reynoso-Hernández, "Unified method for determining the complex propagation constant of reflecting and nonreflecting transmission lines," IEEE Microwave Guided Wave Lett., Aug. 2003.
    • (2003) IEEE Microwave Guided Wave Lett.
    • Reynoso-Hernández, J.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.