A method for computing the characteristic impedance of transmission lines using the wave cascade matrix formalism

61st ARFTG Conference Digest Spring 2003: Measurement Accuracy, ARFTG Spring 2003

Volumn , Issue , 2003, Pages 179-185

  Reynoso Hernandez J A ^a   Rangel Rojo, R ^a   Aceves, M ^b   Zaldivar, I ^b   Sanchez L E ^b   Herrera, M ^b  

^a CENTRO DE INVESTIGACIÓN CIENTÍFICA Y DE EDUCACIÓN SUPERIOR DE ENSENADA   (Mexico)

^b INSTITUTO NACIONAL DE ASTROFÍSICA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

COPLANAR WAVEGUIDES; MATRIX ALGEBRA; PASSIVATION; SILICA;

CHARACTERISTIC IMPEDANCE; DARK CONDITIONS; LINE IMPEDANCE; MATRIX FORMALISM; MATRIX REPRESENTATION; PASSIVATION LAYER; UNIFORM TRANSMISSION LINES; VISIBLE LASERS;

ELECTRIC LINES;

EID: 84954207090     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGS.2003.1216883     Document Type: Conference Paper

References (5)

1. J.A.Reynoso-Hernández, "Unified method for determining the complex propagation constant of reflecting and non-reflecting transmission lines", Accepted for publication in IEEE Microwave and Guided Wave Lett 2003.
2. Y-Chi.Shih, "Broadband characterization of conductor-baked coplanar waveguide using accurate on-wafer measurement techniques", Microwave Journal, Vol 34, pp. 95-105, Apr. 1991.
3. Kür ad Kizilo lu, Nadir Dagli, George L. Matthaei, Stephen I. Long, "Experimental Analysis of transmission line parameters in high-speed GaAs digital circuits interconnects," IEEE Trans., Microwave Theory and Techniques. vol.38, No.8, pp.1361-1367, Aug.1991.
4. 1, R. Rangel-Rojo, M. Aceves, I. Zaldivar, L. E. Sánchez, M. Herrera, "Influence of the Silicon Rich Oxide (SRO) as passivation layer on the Microwave Attenuation Losses of the Coplanar Wave Guides (CPWs) fabricated on high resistivity silicon (HR-Si)", Submitted to publication in IEEE Microwave and Guided Wave Lett.2003
5. 4 films", J. Electrochem. Soc., vol. 125, No. 5, pp. 819-823, May 1978.