A modified blister test to study the adhesion of thin coatings based on local helium ion implantation

Thin Solid Films

Volumn 471, Issue 1-2, 2005, Pages 170-176

  Galindo, R Escobar ^a,d   Van Veen, A ^a   Evans, J H ^b   Schut, H ^a   De Hosson, J Th M ^c  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b University of Groningen ^*  (United Kingdom)

^c UNIVERSITY OF GRONINGEN   (Netherlands)

^d INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Adhesion; Ceramics; Ion implantation; Metals

Indexed keywords

ADHESION; ANNEALING; CERAMIC MATERIALS; HELIUM; ION IMPLANTATION; OPTICAL MICROSCOPY; SCANNING; SCANNING ELECTRON MICROSCOPY;

BLISTERS; CONFOCAL SCANNING OPTICAL MICROSCOPY (CSOM); GAS CONTENT; REGULAR ARRAYS;

COATINGS;

EID: 10644289574     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.06.129     Document Type: Article

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