Characterization of human metal ESD reference discharge event and correlation of generator parameters to failure levels - Part II: Correlation of generator parameters to failure levels

IEEE Transactions on Electromagnetic Compatibility

Volumn 46, Issue 4, 2004, Pages 505-511

  Wang, Kai ^a   Pommerenke, David ^a   Chundru, Ramachandran ^a   Van Doren, Tom ^a   Pio Centola, Federico ^a   Huang, Jiu Sheng ^b  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^b Beijing ESD Research Institute   (China)

Author keywords

Electrostatic discharge (ESD) generator; Fast CMOS system; Induced loop voltage

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTROSTATICS; THRESHOLD VOLTAGE; WAVEFORM ANALYSIS;

DISCHARGE CURRENT; ELECTROSTATIC DISCHARGE (ESD) GENERATOR; FAST CMOS SYSTEM; INDUCED LOOP VOLTAGE;

ELECTROSTATIC GENERATORS;

EID: 10644281333     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2004.837688     Document Type: Article

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