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Applied Physics A: Materials Science and Processing

Volumn 80, Issue 2, 2005, Pages 229-235

Morphology dependence of the dielectric properties of epitaxial BaTiO 3 films and epitaxial BaTiO3/SrTiO3 multilayers

(4) Visinoiu, A a Scholz, R a Alexe, M a Hesse, D a

a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; EPITAXIAL GROWTH; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); MORPHOLOGY; MULTILAYERS; NIOBIUM; SINGLE CRYSTALS; STRONTIUM COMPOUNDS; SURFACE TOPOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

COLUMN BOUNDARIES; FILM THICKNESS; GRAIN MORPHOLOGY; ROOM TEMPERATURE (RT);

BARIUM TITANATE;

EID: 10644266055 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s00339-004-2770-3 Document Type: Article

Times cited : (15)

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