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Volumn 85, Issue 4, 2005, Pages 545-557
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Comparative frequency-resolved photoconductivity studies of amorphous semiconductors
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Author keywords
Lifetime; Photoconduction; Recombination; Trapping
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Indexed keywords
ELECTRIC CONDUCTIVITY;
EVAPORATION;
MATHEMATICAL MODELS;
PHOTOCONDUCTIVITY;
PHOTOCURRENTS;
SEMICONDUCTOR MATERIALS;
THICKNESS MEASUREMENT;
THIN FILMS;
DISTANT-PAIR (DP) MODELS;
LIGHT INTENSITY;
MULTIPLE TRAPPING (MT);
RECOMBINATION;
AMORPHOUS MATERIALS;
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EID: 10444274128
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solmat.2004.05.015 Document Type: Article |
Times cited : (13)
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References (27)
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