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Volumn 2, Issue , 2004, Pages 1492-1498

Low-cost, wafer level underfilling and reliability testing of flip chip devices

Author keywords

[No Author keywords available]

Indexed keywords

FLIP CHIP ON BOARD (FCOB); HIGH ASSEMBLY YIELD; SOLDER BUMPS; UNDERFILLING;

EID: 10444272381     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (6)
  • 1
    • 0034704230 scopus 로고    scopus 로고
    • Flip the chip
    • Dec 22
    • C.P. Wong, S. Luo, Z. Zhang, "Flip the Chip", Science, Dec 22, 2000, 290, 2269
    • (2000) Science , vol.290 , pp. 2269
    • Wong, C.P.1    Luo, S.2    Zhang, Z.3
  • 5
    • 0003607149 scopus 로고    scopus 로고
    • Transforming flip chip into CSP with reworkable wafer level underfill
    • Oahu, Hawaii, February
    • K. Gilleo and D. Blumel, "Transforming Flip Chip into CSP with Reworkable Wafer Level Underfill" Proceedings Pan Pacific Microelectronics Symposium, Oahu, Hawaii, February 1999, pp. 159-165
    • (1999) Proceedings Pan Pacific Microelectronics Symposium , pp. 159-165
    • Gilleo, K.1    Blumel, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.