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Volumn 2, Issue , 2004, Pages 1492-1498
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Low-cost, wafer level underfilling and reliability testing of flip chip devices
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Author keywords
[No Author keywords available]
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Indexed keywords
FLIP CHIP ON BOARD (FCOB);
HIGH ASSEMBLY YIELD;
SOLDER BUMPS;
UNDERFILLING;
CLEAN ROOMS;
COSTS;
ELECTRONICS PACKAGING;
LASER ABLATION;
METALLIZING;
PROBLEM SOLVING;
RELIABILITY;
THERMAL CYCLING;
FLIP CHIP DEVICES;
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EID: 10444272381
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (6)
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