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Volumn 387-389, Issue 1-2 SPEC. ISS., 2004, Pages 585-589
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Does nanocrystalline Cu deform by Coble creep near room temperature?
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Author keywords
Coble creep; Dislocation annihilation; Grain boundaries; Nanocrystalline Cu; Strain rate sensitivity; Ultrafine grained Cu
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Indexed keywords
COMPRESSION TESTING;
COPPER;
CREEP;
GRAIN BOUNDARIES;
SCANNING ELECTRON MICROSCOPY;
THERMAL EFFECTS;
COMPRESSION STRESS;
ELECTRO DEPOSITION (ED);
TENSILE FRACTURE;
NANOSTRUCTURED MATERIALS;
COPPER;
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EID: 10444229622
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.msea.2003.11.086 Document Type: Article |
Times cited : (47)
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References (13)
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