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Volumn 387-389, Issue 1-2 SPEC. ISS., 2004, Pages 585-589

Does nanocrystalline Cu deform by Coble creep near room temperature?

Author keywords

Coble creep; Dislocation annihilation; Grain boundaries; Nanocrystalline Cu; Strain rate sensitivity; Ultrafine grained Cu

Indexed keywords

COMPRESSION TESTING; COPPER; CREEP; GRAIN BOUNDARIES; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS;

EID: 10444229622     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2003.11.086     Document Type: Article
Times cited : (47)

References (13)
  • 12
    • 0000760822 scopus 로고
    • H. Mughrabi (Ed.), in: R.W. Cahn, P. Haasen, E.J. Kramer (Eds.), Materials Science and Technology, VCH Verlagsgesellschaft, Weinheim
    • Blum W. in: H. Mughrabi (Ed.), Plastic Deformation and Fracture of Materials, vol. 6, in: R.W. Cahn, P. Haasen, E.J. Kramer (Eds.), Materials Science and Technology, VCH Verlagsgesellschaft, Weinheim, 1993, p. 359.
    • (1993) Plastic Deformation and Fracture of Materials , vol.6 , pp. 359
    • Blum, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.