Quantitative analysis of low-frequency current oscillation in semi-insulating GaAs

EPJ Applied Physics

Volumn 27, Issue 1-3, 2004, Pages 185-188

  Kiyama, M ^a,b   Yamada, M ^b   Tatsumi, M ^a  

^a SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

^b KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; CONCENTRATION (PROCESS); ELECTRIC FIELDS; ELECTRODES; GALLIUM; IONIZATION; MATHEMATICAL MODELS; THRESHOLD VOLTAGE; WAVEFORM ANALYSIS;

ANODE ELECTRODES; ELECTRON CAPTURE PROCESS; HIGH-FIELD AND NONLINEAR DEFECTS; III-V SEMICONDUCTORS;

OSCILLATIONS;

EID: 10244238842     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2004150     Document Type: Conference Paper

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