A comparative study of microstructure of RuO2 nanorods via Raman scattering and field emission scanning electron microscopy

Solid State Communications

Volumn 131, Issue 6, 2004, Pages 349-353

  Chen, R S ^a   Chen, C C ^a   Huang, Y S ^a   Chia, C T ^b   Chen, H P ^b   Tsai, D S ^a   Tiong, K K ^c  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TAIWAN NORMAL UNIVERSITY   (Taiwan)

^c NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

Author keywords

A. Nanostructures; C. Field emission scanning electron microscopy; E. Raman scattering

Indexed keywords

ASPECT RATIO; CHARGE COUPLED DEVICES; GRAIN BOUNDARIES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; OPTICAL MICROSCOPY; PHOTONS; POLYCRYSTALLINE MATERIALS; RAMAN SCATTERING; RUTHENIUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

CHEMICAL STABILITY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY (FESEM); NANORODS; SPATIAL CORRELATION MODELS;

NANOSTRUCTURED MATERIALS;

EID: 3042758878     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.06.002     Document Type: Article

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