Synthetic IR signature control using emissivity enhancement techniques

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5408, Issue , 2004, Pages 118-126

  Malyutenko, Volodymyr K ^a   Malyutenko, Oleg Yu ^a   Bogatyrenko, Vyacheslav V ^a   Chyrchyk, Sergiy V ^a   Kircher, James R ^b   Murrer, Robert L ^c   Snyder, Donald R ^d  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^b EASTMAN KODAK COMPANY   (United States)

^c Millennium Eng and Intgn Company   (United States)

^d AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

3 16 m spectral range; Ge; Light down conversion; Low observables; Pixelless dynamic scene; Si

Indexed keywords

CAMERAS; GERMANIUM; IMAGE ANALYSIS; INFRARED IMAGING; SEMICONDUCTOR MATERIALS; SILICON; THERMAL EFFECTS;

BANDGAP ENERGY; LIGHT DOWN-CONVERSION; LOW OBSERVABLES; PIXELLESS DYNAMIC SCENE;

IMAGE ENHANCEMENT;

EID: 10044281689     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.537758     Document Type: Conference Paper

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