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Volumn 250, Issue 1-3 SPEC. ISS., 2004, Pages 357-366
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Force measurements between Teflon AF and colloidal silica particles in electrolyte solutions
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Author keywords
Atomic force microscopy; DLVO theory; Silica; Surface forces; Teflon AF
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Indexed keywords
ADSORPTION;
ATOMIC FORCE MICROSCOPY;
COLLOIDS;
HYDROPHOBICITY;
POLYTETRAFLUOROETHYLENES;
SILICA;
VAN DER WAALS FORCES;
COLLOIDAL SILICA PARTICLES;
HYDROPHOBIC POLYMER SURFACE;
POLYMERS;
ELECTROLYTE;
HYDROXYL GROUP;
POLITEF;
POLYMER;
POTASSIUM CHLORIDE;
POTASSIUM HYDROXIDE;
SILICON DIOXIDE;
ADSORPTION;
AQUEOUS SOLUTION;
ATOMIC FORCE MICROSCOPY;
CONFERENCE PAPER;
ELECTRICITY;
FORCE;
HYDROPHOBICITY;
MOLECULAR INTERACTION;
PARTICULATE MATTER;
PRIORITY JOURNAL;
STRENGTH;
SURFACE PROPERTY;
THEORY;
ZETA POTENTIAL;
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EID: 10044272354
PISSN: 09277757
EISSN: None
Source Type: Journal
DOI: 10.1016/j.colsurfa.2004.04.091 Document Type: Conference Paper |
Times cited : (34)
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References (52)
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