Fluorocarbons: Surface free energies and van der Waals interaction

Langmuir

Volumn 12, Issue 11, 1996, Pages 2617-2621

  Drummond, Calum J ^a   Georgaklis, George ^a   Chan, Derek Y C ^b  

^a CSIRO   (Australia)

^b UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5244328235     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la951020v     Document Type: Article

References (54)

1. Plunkett, R. J. U.S. Patent No. 2230654, 1941.
2. Zisman, W. A. Ind. Eng. Chem. 1963, 55, 18.
3. Girafalco, L. A.; Good, R. J. J. Phys. Chem. 1957, 61, 904. Good, R. J.; Girafalco, L. A. J. Phys. Chem. 1960, 64, 561.
4. Girafalco, L. A.; Good, R. J. J. Phys. Chem. 1957, 61, 904. Good, R. J.; Girafalco, L. A. J. Phys. Chem. 1960, 64, 561.
5. Fowkes, F. M. Ind. Eng. Chem. 1964, 56, 40.
6. Tabor, D. In Colloidal Dispersions; Goodwin, J. W., Ed.; Special Publication No. 43; The Royal Society of Chemistry: 1982; Chapter 2.
7. Padday, J. F.; Uffindell, N. D. J. Phys. Chem. 1968, 72, 1407. Israelachvili, J. N. J. Chem. Soc., Faraday Tran. 2 1973, 69, 1729. Aveyard, R.; Saleem, S. M. J. Chem. Soc., Faraday Trans, 1 1976, 72, 1609.
8. Padday, J. F.; Uffindell, N. D. J. Phys. Chem. 1968, 72, 1407. Israelachvili, J. N. J. Chem. Soc., Faraday Tran. 2 1973, 69, 1729. Aveyard, R.; Saleem, S. M. J. Chem. Soc., Faraday Trans, 1 1976, 72, 1609.
9. Padday, J. F.; Uffindell, N. D. J. Phys. Chem. 1968, 72, 1407. Israelachvili, J. N. J. Chem. Soc., Faraday Tran. 2 1973, 69, 1729. Aveyard, R.; Saleem, S. M. J. Chem. Soc., Faraday Trans, 1 1976, 72, 1609.
10. Tabor, D. J. Colloid Interface Sci. 1977, 58, 2.
11. Hough, D. B.; White, L. R. Adv. Colloid Interface Sci. 1980, 14, 3.
12. Parsegian, V. A. In Physical Chemistry: Enriching Topics from Colloid and Surface Science; van Olphen, H., Mysels, K. J., Eds.; IUPAC Comm. 1.6; Theorex: La Jolla, CA, 1975; Chapter 4. Mahanty, J.; Ninham, B. W. Dispersion Forces; Academic Press: London, 1976. White, L. R. In Foundations of Colloid Science; Hunter, R. J., Ed.; Oxford University Press: Oxford, 1989; Vol. 1, Chapter 4. Israelachvili, J. N. Intermolecular and Surface Forces, 2nd ed.; Academic Press: London, 1992; Chapter 11.
13. Parsegian, V. A. In Physical Chemistry: Enriching Topics from Colloid and Surface Science; van Olphen, H., Mysels, K. J., Eds.; IUPAC Comm. 1.6; Theorex: La Jolla, CA, 1975; Chapter 4. Mahanty, J.; Ninham, B. W. Dispersion Forces; Academic Press: London, 1976. White, L. R. In Foundations of Colloid Science; Hunter, R. J., Ed.; Oxford University Press: Oxford, 1989; Vol. 1, Chapter 4. Israelachvili, J. N. Intermolecular and Surface Forces, 2nd ed.; Academic Press: London, 1992; Chapter 11.
14. Parsegian, V. A. In Physical Chemistry: Enriching Topics from Colloid and Surface Science; van Olphen, H., Mysels, K. J., Eds.; IUPAC Comm. 1.6; Theorex: La Jolla, CA, 1975; Chapter 4. Mahanty, J.; Ninham, B. W. Dispersion Forces; Academic Press: London, 1976. White, L. R. In Foundations of Colloid Science; Hunter, R. J., Ed.; Oxford University Press: Oxford, 1989; Vol. 1, Chapter 4. Israelachvili, J. N. Intermolecular and Surface Forces, 2nd ed.; Academic Press: London, 1992; Chapter 11.
15. Parsegian, V. A. In Physical Chemistry: Enriching Topics from Colloid and Surface Science; van Olphen, H., Mysels, K. J., Eds.; IUPAC Comm. 1.6; Theorex: La Jolla, CA, 1975; Chapter 4. Mahanty, J.; Ninham, B. W. Dispersion Forces; Academic Press: London, 1976. White, L. R. In Foundations of Colloid Science; Hunter, R. J., Ed.; Oxford University Press: Oxford, 1989; Vol. 1, Chapter 4. Israelachvili, J. N. Intermolecular and Surface Forces, 2nd ed.; Academic Press: London, 1992; Chapter 11.
16. 7
17. Lifshitz, E. M. J. Exp. Theor. Phys. USSR 1955, 29, 94 (Sov. Phys. JETP 1956, 2, 73). Dzyaloshinskii, I. E.; Lifshitz, E. M.; Pitaevskii, L. P. Adv. Phys. 1961, 10, 165.
18. Lifshitz, E. M. J. Exp. Theor. Phys. USSR 1955, 29, 94 (Sov. Phys. JETP 1956, 2, 73). Dzyaloshinskii, I. E.; Lifshitz, E. M.; Pitaevskii, L. P. Adv. Phys. 1961, 10, 165.
19. Lifshitz, E. M. J. Exp. Theor. Phys. USSR 1955, 29, 94 (Sov. Phys. JETP 1956, 2, 73). Dzyaloshinskii, I. E.; Lifshitz, E. M.; Pitaevskii, L. P. Adv. Phys. 1961, 10, 165.
20. Ninham, B. W.; Parsegian, V. A. Biophys. J. 1970, 10, 646.
21. Rohrback, G. H.; Cady, G. H. J. Am. Chem. Soc. 1949, 71, 1938. Oliver, G. D.; Blumkin, S.; Cunningham, C. W. J. Am. Chem. Soc. 1951, 73, 5722. Stiles, V. E.; Cady, G. H. J. Am. Chem. Soc. 1952, 74, 3771. Beall, E. F.; Wilson, D. L., University of Maryland, Fluorinert Liquids, Product Manual, 3M Industrial Chemicals Products Division, 1992. Lowry, J. H.; Mendlowitz, J. S.; Subramanian, N. S. Opt. Eng. 1992, 31, 1982.
22. Rohrback, G. H.; Cady, G. H. J. Am. Chem. Soc. 1949, 71, 1938. Oliver, G. D.; Blumkin, S.; Cunningham, C. W. J. Am. Chem. Soc. 1951, 73, 5722. Stiles, V. E.; Cady, G. H. J. Am. Chem. Soc. 1952, 74, 3771. Beall, E. F.; Wilson, D. L., University of Maryland, Fluorinert Liquids, Product Manual, 3M Industrial Chemicals Products Division, 1992. Lowry, J. H.; Mendlowitz, J. S.; Subramanian, N. S. Opt. Eng. 1992, 31, 1982.
23. Rohrback, G. H.; Cady, G. H. J. Am. Chem. Soc. 1949, 71, 1938. Oliver, G. D.; Blumkin, S.; Cunningham, C. W. J. Am. Chem. Soc. 1951, 73, 5722. Stiles, V. E.; Cady, G. H. J. Am. Chem. Soc. 1952, 74, 3771. Beall, E. F.; Wilson, D. L., University of Maryland, Fluorinert Liquids, Product Manual, 3M Industrial Chemicals Products Division, 1992. Lowry, J. H.; Mendlowitz, J. S.; Subramanian, N. S. Opt. Eng. 1992, 31, 1982.
24. Rohrback, G. H.; Cady, G. H. J. Am. Chem. Soc. 1949, 71, 1938. Oliver, G. D.; Blumkin, S.; Cunningham, C. W. J. Am. Chem. Soc. 1951, 73, 5722. Stiles, V. E.; Cady, G. H. J. Am. Chem. Soc. 1952, 74, 3771. Beall, E. F.; Wilson, D. L., University of Maryland, Fluorinert Liquids, Product Manual, 3M Industrial Chemicals Products Division, 1992. Lowry, J. H.; Mendlowitz, J. S.; Subramanian, N. S. Opt. Eng. 1992, 31, 1982.
25. Rohrback, G. H.; Cady, G. H. J. Am. Chem. Soc. 1949, 71, 1938. Oliver, G. D.; Blumkin, S.; Cunningham, C. W. J. Am. Chem. Soc. 1951, 73, 5722. Stiles, V. E.; Cady, G. H. J. Am. Chem. Soc. 1952, 74, 3771. Beall, E. F.; Wilson, D. L., University of Maryland, Fluorinert Liquids, Product Manual, 3M Industrial Chemicals Products Division, 1992. Lowry, J. H.; Mendlowitz, J. S.; Subramanian, N. S. Opt. Eng. 1992, 31, 1982.
26. λ values were obtained at 436, 486, 546, 589, and 656 nm.
27. Rance, D. G. Ph.D. Thesis, The University of Bristol, 1976.
28. Benner, R. G.; Benning, A. F.; Downing, F. B.; Irwin, C. F.; Johnson, K. C.; Linch, A. L.; Parmlee, H. M.; Wirth, W. V. Ind. Eng. Chem. 1947, 39, 329. Fowler, R. D.; Hamilton, J. M.; Kasper, J. S.; Weber, C. E.; Buford, W. B., III; Anderson, H. C. Ind. Eng. Chem. 1947, 39, 375. Haszeldine, R. N.; Smith, F. J. Chem. Soc. 1951, 603. Halper, L. A.; Timmons, C. O.; Zisman, W. A. J. Colloid Interface Sci. 1972, 38, 511. Nishikido, N.; Mahler, W.; Mukerjee, P. Langmuir 1989, 5, 227. Resnick, P. R. Mater. Res. Soc. Symp. Proc. 1990, 167, 105. Teflon AF: Amorphous Fluoropolymers, Product Information, DuPont Specialty Polymers Division, 1992.
29. Benner, R. G.; Benning, A. F.; Downing, F. B.; Irwin, C. F.; Johnson, K. C.; Linch, A. L.; Parmlee, H. M.; Wirth, W. V. Ind. Eng. Chem. 1947, 39, 329. Fowler, R. D.; Hamilton, J. M.; Kasper, J. S.; Weber, C. E.; Buford, W. B., III; Anderson, H. C. Ind. Eng. Chem. 1947, 39, 375. Haszeldine, R. N.; Smith, F. J. Chem. Soc. 1951, 603. Halper, L. A.; Timmons, C. O.; Zisman, W. A. J. Colloid Interface Sci. 1972, 38, 511. Nishikido, N.; Mahler, W.; Mukerjee, P. Langmuir 1989, 5, 227. Resnick, P. R. Mater. Res. Soc. Symp. Proc. 1990, 167, 105. Teflon AF: Amorphous Fluoropolymers, Product Information, DuPont Specialty Polymers Division, 1992.
30. Benner, R. G.; Benning, A. F.; Downing, F. B.; Irwin, C. F.; Johnson, K. C.; Linch, A. L.; Parmlee, H. M.; Wirth, W. V. Ind. Eng. Chem. 1947, 39, 329. Fowler, R. D.; Hamilton, J. M.; Kasper, J. S.; Weber, C. E.; Buford, W. B., III; Anderson, H. C. Ind. Eng. Chem. 1947, 39, 375. Haszeldine, R. N.; Smith, F. J. Chem. Soc. 1951, 603. Halper, L. A.; Timmons, C. O.; Zisman, W. A. J. Colloid Interface Sci. 1972, 38, 511. Nishikido, N.; Mahler, W.; Mukerjee, P. Langmuir 1989, 5, 227. Resnick, P. R. Mater. Res. Soc. Symp. Proc. 1990, 167, 105. Teflon AF: Amorphous Fluoropolymers, Product Information, DuPont Specialty Polymers Division, 1992.
31. Benner, R. G.; Benning, A. F.; Downing, F. B.; Irwin, C. F.; Johnson, K. C.; Linch, A. L.; Parmlee, H. M.; Wirth, W. V. Ind. Eng. Chem. 1947, 39, 329. Fowler, R. D.; Hamilton, J. M.; Kasper, J. S.; Weber, C. E.; Buford, W. B., III; Anderson, H. C. Ind. Eng. Chem. 1947, 39, 375. Haszeldine, R. N.; Smith, F. J. Chem. Soc. 1951, 603. Halper, L. A.; Timmons, C. O.; Zisman, W. A. J. Colloid Interface Sci. 1972, 38, 511. Nishikido, N.; Mahler, W.; Mukerjee, P. Langmuir 1989, 5, 227. Resnick, P. R. Mater. Res. Soc. Symp. Proc. 1990, 167, 105. Teflon AF: Amorphous Fluoropolymers, Product Information, DuPont Specialty Polymers Division, 1992.
32. Benner, R. G.; Benning, A. F.; Downing, F. B.; Irwin, C. F.; Johnson, K. C.; Linch, A. L.; Parmlee, H. M.; Wirth, W. V. Ind. Eng. Chem. 1947, 39, 329. Fowler, R. D.; Hamilton, J. M.; Kasper, J. S.; Weber, C. E.; Buford, W. B., III; Anderson, H. C. Ind. Eng. Chem. 1947, 39, 375. Haszeldine, R. N.; Smith, F. J. Chem. Soc. 1951, 603. Halper, L. A.; Timmons, C. O.; Zisman, W. A. J. Colloid Interface Sci. 1972, 38, 511. Nishikido, N.; Mahler, W.; Mukerjee, P. Langmuir 1989, 5, 227. Resnick, P. R. Mater. Res. Soc. Symp. Proc. 1990, 167, 105. Teflon AF: Amorphous Fluoropolymers, Product Information, DuPont Specialty Polymers Division, 1992.
33. Benner, R. G.; Benning, A. F.; Downing, F. B.; Irwin, C. F.; Johnson, K. C.; Linch, A. L.; Parmlee, H. M.; Wirth, W. V. Ind. Eng. Chem. 1947, 39, 329. Fowler, R. D.; Hamilton, J. M.; Kasper, J. S.; Weber, C. E.; Buford, W. B., III; Anderson, H. C. Ind. Eng. Chem. 1947, 39, 375. Haszeldine, R. N.; Smith, F. J. Chem. Soc. 1951, 603. Halper, L. A.; Timmons, C. O.; Zisman, W. A. J. Colloid Interface Sci. 1972, 38, 511. Nishikido, N.; Mahler, W.; Mukerjee, P. Langmuir 1989, 5, 227. Resnick, P. R. Mater. Res. Soc. Symp. Proc. 1990, 167, 105. Teflon AF: Amorphous Fluoropolymers, Product Information, DuPont Specialty Polymers Division, 1992.
34. Benner, R. G.; Benning, A. F.; Downing, F. B.; Irwin, C. F.; Johnson, K. C.; Linch, A. L.; Parmlee, H. M.; Wirth, W. V. Ind. Eng. Chem. 1947, 39, 329. Fowler, R. D.; Hamilton, J. M.; Kasper, J. S.; Weber, C. E.; Buford, W. B., III; Anderson, H. C. Ind. Eng. Chem. 1947, 39, 375. Haszeldine, R. N.; Smith, F. J. Chem. Soc. 1951, 603. Halper, L. A.; Timmons, C. O.; Zisman, W. A. J. Colloid Interface Sci. 1972, 38, 511. Nishikido, N.; Mahler, W.; Mukerjee, P. Langmuir 1989, 5, 227. Resnick, P. R. Mater. Res. Soc. Symp. Proc. 1990, 167, 105. Teflon AF: Amorphous Fluoropolymers, Product Information, DuPont Specialty Polymers Division, 1992.
35. IR.
36. Renfrew, M. M.; Lewis, E. E. Ind. Eng. Chem. 1946, 38, 870. Hanford, W. E.; Joyce, R. M. J. Am. Chem. Soc. 1946, 68, 2082. Roff, W. J.; Scott, J. R. Fibres, Films, Plastics and Rubbers: A Handbook of Common Polymers; Butterworths: London, 1971. Van Krevelen, D. W. Properties of Polymers: Their Correlation with Chemical Structure; Their Numerical Estimation and Prediction from Additive Group Contributions, 3rd ed.; Elsevier: Amsterdam, 1990; pp 790-792. Domininghaus, H. Plastics for Engineers: Materials, Properties and Applications, 3rd ed.; Hanser: Munich, 1993; Chapter 12.
37. Renfrew, M. M.; Lewis, E. E. Ind. Eng. Chem. 1946, 38, 870. Hanford, W. E.; Joyce, R. M. J. Am. Chem. Soc. 1946, 68, 2082. Roff, W. J.; Scott, J. R. Fibres, Films, Plastics and Rubbers: A Handbook of Common Polymers; Butterworths: London, 1971. Van Krevelen, D. W. Properties of Polymers: Their Correlation with Chemical Structure; Their Numerical Estimation and Prediction from Additive Group Contributions, 3rd ed.; Elsevier: Amsterdam, 1990; pp 790-792. Domininghaus, H. Plastics for Engineers: Materials, Properties and Applications, 3rd ed.; Hanser: Munich, 1993; Chapter 12.
38. Renfrew, M. M.; Lewis, E. E. Ind. Eng. Chem. 1946, 38, 870. Hanford, W. E.; Joyce, R. M. J. Am. Chem. Soc. 1946, 68, 2082. Roff, W. J.; Scott, J. R. Fibres, Films, Plastics and Rubbers: A Handbook of Common Polymers; Butterworths: London, 1971. Van Krevelen, D. W. Properties of Polymers: Their Correlation with Chemical Structure; Their Numerical Estimation and Prediction from Additive Group Contributions, 3rd ed.; Elsevier: Amsterdam, 1990; pp 790-792. Domininghaus, H. Plastics for Engineers: Materials, Properties and Applications, 3rd ed.; Hanser: Munich, 1993; Chapter 12.
39. Renfrew, M. M.; Lewis, E. E. Ind. Eng. Chem. 1946, 38, 870. Hanford, W. E.; Joyce, R. M. J. Am. Chem. Soc. 1946, 68, 2082. Roff, W. J.; Scott, J. R. Fibres, Films, Plastics and Rubbers: A Handbook of Common Polymers; Butterworths: London, 1971. Van Krevelen, D. W. Properties of Polymers: Their Correlation with Chemical Structure; Their Numerical Estimation and Prediction from Additive Group Contributions, 3rd ed.; Elsevier: Amsterdam, 1990; pp 790-792. Domininghaus, H. Plastics for Engineers: Materials, Properties and Applications, 3rd ed.; Hanser: Munich, 1993; Chapter 12.
40. Renfrew, M. M.; Lewis, E. E. Ind. Eng. Chem. 1946, 38, 870. Hanford, W. E.; Joyce, R. M. J. Am. Chem. Soc. 1946, 68, 2082. Roff, W. J.; Scott, J. R. Fibres, Films, Plastics and Rubbers: A Handbook of Common Polymers; Butterworths: London, 1971. Van Krevelen, D. W. Properties of Polymers: Their Correlation with Chemical Structure; Their Numerical Estimation and Prediction from Additive Group Contributions, 3rd ed.; Elsevier: Amsterdam, 1990; pp 790-792. Domininghaus, H. Plastics for Engineers: Materials, Properties and Applications, 3rd ed.; Hanser: Munich, 1993; Chapter 12.
41. Wu, S. In Polymer Handbook, 3rd ed.; Brandrup, J., Immergut, E. H., Eds.; Wiley-Interscience: New York, 1989; pp 411-434.
42. Dettre, R. H.; Johnson, R. E. J. Colloid Interface Sci. 1969, 37, 568. Wu, S. J. Macromol. Sci., Rev. Macromol. Chem. 1974, C10, 1.
43. Dettre, R. H.; Johnson, R. E. J. Colloid Interface Sci. 1969, 37, 568. Wu, S. J. Macromol. Sci., Rev. Macromol. Chem. 1974, C10, 1.
44. -1) from ref 22.
45. Fox, H. W.; Zisman, W. A. J. Colloid Sci. 1950, 5, 514.
46. 0 for LD PTFE can be calculated as 0.165 ± 0.005 nm.
47. -1) was also placed on the Teflon AF surfaces, but reliable contact angles could not be obtained because the liquid rapidly penetrated the surface.
48. Chaudhury, M. K.; Whitesides, G. M. Science 1992, 255, 1230.
49. Groh, W.; Zimmermann, A. Macromolecules 1991, 24, 6660.
50. The use of the AFM (Nanoscope III; Digital Instruments, CA) to quantitatively measure the force of interaction between a sphere and a flat plate has been reported in several recent works. For experimental details see, for example: Ducker, W. A.; Senden, T. J.; Pashley, R. M. Langmuir 1992, 8, 1831. Larson, I.; Drummond, C. J.; Chan, D. Y. C.; Grieser, F. J. Am. Chem. Soc. 1993, 115, 11885. Drummond, C. J.; Senden, T. J. Colloids Surf., A 1994, 87, 217. The measured force of interaction is considered to have an accuracy of ± 20%, with the major uncertainty (±15%) arising from the experimental determination of the v-shaped cantilever spring constant (k). The surfaces generally used in AFM force measurements are too rough and inelastic to get a quantitative value for the reversible work of adhesion.
51. The use of the AFM (Nanoscope III; Digital Instruments, CA) to quantitatively measure the force of interaction between a sphere and a flat plate has been reported in several recent works. For experimental details see, for example: Ducker, W. A.; Senden, T. J.; Pashley, R. M. Langmuir 1992, 8, 1831. Larson, I.; Drummond, C. J.; Chan, D. Y. C.; Grieser, F. J. Am. Chem. Soc. 1993, 115, 11885. Drummond, C. J.; Senden, T. J. Colloids Surf., A 1994, 87, 217. The measured force of interaction is considered to have an accuracy of ± 20%, with the major uncertainty (±15%) arising from the experimental determination of the v-shaped cantilever spring constant (k). The surfaces generally used in AFM force measurements are too rough and inelastic to get a quantitative value for the reversible work of adhesion.
52. The use of the AFM (Nanoscope III; Digital Instruments, CA) to quantitatively measure the force of interaction between a sphere and a flat plate has been reported in several recent works. For experimental details see, for example: Ducker, W. A.; Senden, T. J.; Pashley, R. M. Langmuir 1992, 8, 1831. Larson, I.; Drummond, C. J.; Chan, D. Y. C.; Grieser, F. J. Am. Chem. Soc. 1993, 115, 11885. Drummond, C. J.; Senden, T. J. Colloids Surf., A 1994, 87, 217. The measured force of interaction is considered to have an accuracy of ± 20%, with the major uncertainty (±15%) arising from the experimental determination of the v-shaped cantilever spring constant (k). The surfaces generally used in AFM force measurements are too rough and inelastic to get a quantitative value for the reversible work of adhesion.
53. 2 area) was less rough than the native oxidized wafer (rms roughness of 0.8 nm with a few features up to 10 nm).
54. Derjaguin, B. V. Kolloid Z. 1934, 69, 155.