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Volumn 25, Issue 4, 2005, Pages 497-503
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Diffusion thermopower due to interface roughness-induced piezoelectric scattering in lattice-mismatched semiconductor quantum wells
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Author keywords
Diffusion thermopower; Scattering parameter; Surface roughness scattering; Surface roughness induced piezoelectric scattering
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Indexed keywords
DIFFUSION;
ELECTRON GAS;
FUNCTIONS;
PIEZOELECTRICITY;
RELAXATION PROCESSES;
SCATTERING PARAMETERS;
SURFACE ROUGHNESS;
DIFFUSION THERMOPOWER;
LATTICE MISMATCH;
SURFACE ROUGHNESS SCATTERING;
SURFACE ROUGHNESS-INDUCED PIEZOELECTRIC SCATTERING;
SEMICONDUCTOR QUANTUM WELLS;
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EID: 10044246001
PISSN: 13869477
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physe.2004.08.097 Document Type: Article |
Times cited : (6)
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References (14)
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