Investigation of incubation in ArF excimer laser irradiated poly(methyl-methacrylate) using pulsed force mode atomic force microscopy

Journal of Applied Physics

Volumn 96, Issue 10, 2004, Pages 5548-5551

  Hopp, B ^a   Smausz, T ^a   Kokavecz, J ^a   Kresz, N ^a   Bor, Z ^a   Hild, S ^b   Marti, O ^b  

^a UNIVERSITY OF SZEGED   (Hungary)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ARGON; ATOMIC FORCE MICROSCOPY; FLUORINE; LASER BEAM EFFECTS; LIGHTING; MORPHOLOGY; POLYMETHYL METHACRYLATES; SURFACE TENSION; ULTRAVIOLET RADIATION;

INCUBATION EFFECTS; MORPHOLOGICAL CHANGES; PULSED FORCE MODE EXTENSION; UV LASER IRRADIATED POLYMER;

EXCIMER LASERS;

EID: 10044243933     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1803632     Document Type: Article

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