메뉴 건너뛰기




Volumn , Issue , 2004, Pages 121-124

Effect of inductance on interconnect propagation delay in VLSI circuits

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CMOS INTEGRATED CIRCUITS; DELAY CIRCUITS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; FREQUENCY DOMAIN ANALYSIS; INDUCTANCE; NATURAL FREQUENCIES;

EID: 10044224670     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (19)

References (5)
  • 1
    • 0033891230 scopus 로고    scopus 로고
    • Effects of inductance on the propagation delay and repeater insertion in VLSI circuits
    • April
    • Y.I.Ismail, E.G.Friedman, Effects of inductance on the propagation delay and repeater insertion in VLSI circuits, IEEE Tran. VLSI Sys., vol. 8, No. 2, April 2000, pp. 195-206.
    • (2000) IEEE Tran. VLSI Sys. , vol.8 , Issue.2 , pp. 195-206
    • Ismail, Y.I.1    Friedman, E.G.2
  • 2
    • 0031246188 scopus 로고    scopus 로고
    • When are transmission-line effects important for on-chip inerconnections
    • Octob
    • A. Deutsch et al., When are transmission-line effects important for on-chip inerconnections, IEEE Tran.on MTT., vol. 45, No. 10, Octob.1997, pp. 1836-1846.
    • (1997) IEEE Tran.on MTT. , vol.45 , Issue.10 , pp. 1836-1846
    • Deutsch, A.1
  • 3
    • 0036683914 scopus 로고    scopus 로고
    • Analysis on-chip inductance effects for distributed RLC interconnects
    • august
    • K.Banerjee, A.Mehrotra, Analysis on-chip inductance effects for distributed RLC interconnects, IEEE Tran. On CAD of Integr. Circuits and Syst., vol.16, No. 8, august 2002. pp. 904-915.
    • (2002) IEEE Tran. on CAD of Integr. Circuits and Syst. , vol.16 , Issue.8 , pp. 904-915
    • Banerjee, K.1    Mehrotra, A.2
  • 4
    • 0037480968 scopus 로고    scopus 로고
    • A novel method for worst-case interconnet estimation
    • June
    • B. Chen, H.Young, R.Luo, H.Wang, A novel method for worst-case interconnet estimation, IEEE CAS-I, vol. 50, No.6, June 2003, pp. 778-781.
    • (2003) IEEE CAS-I , vol.50 , Issue.6 , pp. 778-781
    • Chen, B.1    Young, H.2    Luo, R.3    Wang, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.