Nanoscopic magnetic field sensor based on extraordinary magnetoresistance

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 21, Issue 6, 2003, Pages 3002-3006

  Solin, S A ^a   Mines, D R ^b   Rowe, A C H ^b   Tsai, J S ^c   Pashkin, Yu A ^c  

^a WASHINGTON UNIVERSITY   (United States)

^b NEC LABORATORIES AMERICA   (United States)

^c NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CHARGE CARRIERS; HETEROJUNCTIONS; IMAGE ANALYSIS; LEAKAGE CURRENTS; MAGNETIC FIELDS; MAGNETIC HEADS; MAGNETIC MOMENTS; MAGNETIC RECORDING; MAGNETIC SHIELDING; MAGNETIC THIN FILMS; RANDOM PROCESSES; SEMICONDUCTOR QUANTUM WELLS; SENSORS; SIGNAL TO NOISE RATIO; TEMPERATURE MEASUREMENT;

EXTRAORDINARY MAGNETORESISTANCE (EMR); MAGNETIC IMAGING; MAGNETIC NOISE; MAGNETIC SENSORS; MESOSCOPIC PHYSICS;

MAGNETORESISTANCE;

EID: 0942300026     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1627811     Document Type: Conference Paper

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