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Volumn 13, Issue 7, 2000, Pages 1023-1028
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Studies of the improvement in microstructure of Y2O3 buffer layers and its effect on YBa2Cu3O7-x film growth
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Author keywords
[No Author keywords available]
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Indexed keywords
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
DEPOSITION;
ELECTRON BEAMS;
EVAPORATION;
FILM GROWTH;
NICKEL;
PRESSURE EFFECTS;
PULSED LASER APPLICATIONS;
BUFFER LAYERS;
ELECTRON BEAM EVAPORATION;
PERCOLATIVE CURRENT FLOW;
YTTRIUM BARIUM COPPER OXIDES;
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EID: 0034225215
PISSN: 09532048
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-2048/13/7/320 Document Type: Article |
Times cited : (12)
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References (6)
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