Microstructure of electron-beam-evaporated epitaxial yttria-stabilized zirconia/CeO2 bilayers on biaxially textured Ni tape

Physica C: Superconductivity and its Applications

Volumn 307, Issue 1-2, 1998, Pages 87-98

  Yang, Chau Yun ^a   Babcock, S E ^a   Goyal, A ^b   Paranthaman, M ^b   List, F A ^b   Norton, D P ^b   Kroeger, D M ^b   Ichinose, A ^c  

^a University of Wisconsin Madison ^*  (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c Electric Power Industry   (Japan)

Author keywords

Biaxial texture; Buffer layers; CeO2; Coated conductors; RABiTS ; YBa2Cu3O7 ; YSZ

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CERIUM COMPOUNDS; CRYSTAL MICROSTRUCTURE; CRYSTALLOGRAPHY; DEPOSITION; MORPHOLOGY; NICKEL; PULSED LASER APPLICATIONS; SINTERING; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

CERIUM OXIDE; PULSED LASER DEPOSITION; X RAY POLE FIGURE ANALYSIS; YTTRIA-STABILIZED ZIRCONIA;

SUPERCONDUCTING FILMS;

EID: 0032179140     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(98)00419-5     Document Type: Article

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