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Volumn 21, Issue 6, 2003, Pages 2492-2495

SiC/Si-dots multilayer structures formed by supersonic free jets of CH 3SiH3 and Si3H8

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; CRYSTAL ORIENTATION; FILM GROWTH; JETS; MULTILAYERS; SILANES; SPUTTERING; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0942288903     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (17)
  • 7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.