First test of cold edgeless silicon microstrip detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 518, Issue 1-2, 2004, Pages 264-267

  Avati, V ^a   Boccone, V ^b   Borer, K ^c   Bozzo, M ^b   Capra, R ^b   Casagrande, L ^d   Eggert, K ^a   Heijne, E ^a   Klauke, S ^a   Li, Z ^e   Maki T ^f   Morelli, A ^b   Oljemark, F ^f   Palmieri, V G ^f   Perea Solano, B ^a   Tapprogge, S ^f  

^a CERN   (Switzerland)

^b UNIVERSITY OF GENOA   (Italy)

^c UNIVERSITY OF BERN   (Switzerland)

^d UNIVERSITY OF ROME TOR VERGATA   (Italy)

^e BROOKHAVEN NATIONAL LABORATORY   (United States)

^f HELSINKI INSTITUTE OF PHYSICS   (Finland)

Author keywords

Cryogenics; Elastic scattering; High energy physics; Silicon detector; Tracking

Indexed keywords

CRYOGENICS; HEAT CONDUCTION; HIGH ENERGY PHYSICS; LASER BEAMS; LEAKAGE CURRENTS; MICROSTRIP DEVICES; SILICON; TELESCOPES;

ELASTIC SCATTERING; SILICON DETECTORS; TRACKING;

PARTICLE DETECTORS;

EID: 0942288166     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.10.078     Document Type: Conference Paper

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4. W.H. Bell, et al., Proceedings of the Eighth Pisa Meet, La Biodola, 2000.
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7. Anelli G., et al. Nucl. Instr. and Meth. A. 512:2003;117.