Domain motion of ferroelectricity of Bi2SrTa2O9 single crystals under an AC-voltage electric field

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 2 A, 1999, Pages 795-799

  Machida, Akio ^a   Nagasawa, Naomi ^a   Ami, Takaaki ^a   Suzuki, Masayuki ^a  

^a SONY CORPORATION   (Japan)

Author keywords

Bi layer structured ferroelectric; Chemical composition; Coercive field; Domain motion; Domain structure; FeRAM; Ferroelectricity; Paraelectric phase; Remanent polarization; Self flux method; Single crystal; Vapor phase

Indexed keywords

EID: 0942273389     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.795     Document Type: Article

References (27)

1. T. Nakamura, R. Muhammet, M. Shimizu and T. Shiosaki: Jpn. J. Appl. Phys. 32 (1993) 4086.
2. Y. Toyoda, Y. Hamaji, K. Tomono and D. A. Payne: Jpn. J. Appl. Phys. 33(1994)5543.
3. K. Yoshimori, M. Ishinabe, S. Okamura and T. Tsukamoto: Jpn. J. Appl. Phys. 33(1994) 2425.
4. K. Amanuma, T. Hase and Y. Miyasaka: Appl. Phys. Lett. 66 (1995) 221.
5. T. Mihara, H. Yoshimori, H. Watanabe and C. A. Paz de Araujo: Jpn. J. Appl. Phys. 34 (1995) 5233.
6. R. Dat, J. K. Lee, O. Auciello and A. I. Kingon: Appl. Phys. Lett. 67 (1995)572.
7. S. B. Desu and D. P. Vijay: Mater. Sci. & Eng. B 32 (1995) 75.
8. S. B. Desu and D. P. Vijay: Mater. Sci. & Eng. B 32 (1995) 83.
9. C. Araujo, J. Scott, R. Goddfrey and L. McMillan: Appl. Phys. Lett. 48 (1986) 1439.
10. T. Shiosaki: Oyo Buturi 62 (1993) 1212 [in Japanese]
11. C. A. Paz de Araujo, J. D. Cuchiaro, L. D. McMillan, M. C. Scott and J. F. Scott: Nature 374 (1995) 627.
12. T. Ami, K. Hironaka, C. Isobe, N. Nagel, M. Sugiyama, Y. Ikeda, K. Watanabe, A. Machida, K. Miura and M. Tanaka: Mater. Res. Soc. Symp. Proc. 415 (1996) 195.
13. I. Koiwa: Bull. Solid Slate Phys. & Appl. 3 (1997)16.
14. C. D. Gutlebcn, Y. Ikeda, C. Isobe, A. Machida, T. Ami, K. Hironaka and E. Morita: Mater. Res. Soc. Symp. Proc. 415 (1996) 201.
15. M. Suzuki, N. Nagasawa, A. Machida and T. Ami: Jpn. J. Appl. Phys. 34(1996)5096.
16. N. Nagasawa, A. Machida, T. Ami and M. Suzuki: J. Ceram. Soc. Jpn. 106 (1998) 477.
17. A. Machida, N. Nagasawa, T. Ami and M. Suzuki: Jpn. J. Appl. Phys. 36(1997)7267.
18. A. D. Rae, J. G. Thompson and R. L. Withers: Acta. Cryst. B 48 (1992) 418.
19. Ki-Young Oh, K. Uchino and E. Cross: J. Am. Ceram. Soc. 77 (1994) 2809.
20. K. Takahashi, H. Ueda, T. Suzuki and K. Kakegawa: Proc. 6th Int. Meet. Ferroelectricity, Kobe 1985, Jpn. J. Appl. Phys. 24 (1985) Suppl. 24-2, p. 616.
21. T. Atsuki, N. Soyama, T. Yonezawa and K. Ogi: Jpn. J. Appl. Phys. 34 (1995) 5096.
22. H. Watanabe, T. Mihara, H. Yoshimori and C. A. Paz de Araujo: Jpn. J. Appl. Phys. 34(1995)5240.
23. Y. Ito, M. Ushikubo, S. Yokoyama, H. Matunaga, T.Atuki, T. Yonezawa and K. Ogi: Jpn. J. Appl. Phys. 35 (1996) 4925.
24. T. Noguchi, T. Hase, and Y. Miyasaka: Jpn. J. Appl. Phys. 35 (1996) 4900.
25. J. F. Scott and B. Poulingny: J. Appl. Phys. 64 (1988) 1547.
26. K. Amanuma and T. Kunio: Jpn. J. Appl. Phys. 35 (1996) 5229.
27. H. Maiwa, N. Ichinose and K. Okazaki: Jpn. J. Appl. Phys. 33 (1994) 5240.