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Volumn 518, Issue 1-2, 2004, Pages 357-361

Characterization of 13 and 30 μm thick hydrogenated amorphous silicon diodes deposited over CMOS integrated circuits for particle detection application

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DIODES; HYDROGENATION; LEAKAGE CURRENTS; PARTICLE DETECTORS; PULSED LASER APPLICATIONS; THERMAL EFFECTS; THIN FILMS; VOLTAGE MEASUREMENT;

EID: 0942266478     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.11.022     Document Type: Conference Paper
Times cited : (12)

References (4)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.