Measurement of random processes at rough surfaces with digital speckle correlation

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 21, Issue 2, 2004, Pages 252-262

  Fricke Begemann, Thomas ^a   Hinsch, Klaus D ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SCATTERING; OPTICAL MICROSCOPY; OPTICAL VARIABLES MEASUREMENT; PHOTOLITHOGRAPHY; RANDOM PROCESSES; ROUGHNESS MEASUREMENT; SPECKLE;

DIGITAL SPECKLE CORRELATION; SCANNING FORCE MICROSCOPY;

OPTICAL CORRELATION;

EID: 0842332871     PISSN: 10847529     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAA.21.000252     Document Type: Article

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