Detection of Surface Microstructure Changes by Electronic Speckle Pattern Interferometry

Optics and Lasers in Engineering

Volumn 26, Issue 2-3 SPEC. ISS., 1997, Pages 165-178

  Gulker G ^a   Hinsch, K D ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; MICROBIOLOGY; MICROSTRUCTURE; OPTICAL CORRELATION; PHASE SHIFT; SPECKLE; SURFACE STRUCTURE;

ELECTRONIC SPECKLE PATTERN INTERFEROMETRY; SPATIALLY RESOLVED IMAGE DECORRELATION; SURFACE MICROSTRUCTURE CHANGES;

INTERFEROMETRY;

EID: 0031060054     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/0143-8166(95)00111-5     Document Type: Article

References (13)

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