Irradiation of polymers using electron beams: Characterization of positive ions through the time-of-flight technique;Irradiação de polímeros com feixe de elétrons: Caracterização de íons positivos através da técnica de tempo-de-vôo

Quimica Nova

Volumn 27, Issue 1, 2004, Pages 160-163

  Rocco, Maria Luiza Miranda ^a   Pontes, Frederico Celestino ^a   Faraudo, Gustavo Sebastian ^a   De Souza, Gerardo Gerson Bezerra ^a   Weibel, Daniel Eduardo ^b   Pinho, Roberto Rosas ^c  

^a Depto Quim Organ Inst Quim U   (Brazil)

^b UNIVERSIDAD NACIONAL DE CÓRDOBA   (Argentina)

^c FEDERAL UNIVERSITY OF JUIZ DE FORA   (Brazil)

Author keywords

Electron stimulated desorption; Polymers; Time of flight spectrometer

Indexed keywords

ION; POLY(METHYL METHACRYLATE); POLYMER; POLYVINYLCHLORIDE;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL INTERACTION; DESORPTION; ELECTRON; ELECTRON BEAM; IRRADIATION; PULSED ELECTRIC FIELD; SOLID; SURFACE PROPERTY; TIME OF FLIGHT MASS SPECTROMETRY;

EID: 0842312350     PISSN: 01004042     EISSN: None     Source Type: Journal    
DOI: 10.1590/s0100-40422004000100027     Document Type: Article

References (28)

1. Bishop, H. E. Em Methods of Surface Analysis; Walls, J. M., ed.; Cambridge University Press; Cambridge, 1989, p. 87.
2. Dreisewerd, K.; Schurenberg, M.; Karas, M.; Hillenkamp, F.; Int. J. Mass Spectrom. Ion Processes 1995, 141, 127.
3. Levis, R. J.; Annu. Rev. Phys. Chem. 1994, 45, 483.
4. Spengler, B.; Hubert, M.; J. Am. Soc. Mass Spectrom. 2002, 13, 735.
5. Benninghoven, A.; Surf. Sci. 1994, 299/300, 246.
6. Stapel, D.; Thiemann, M.; Benninghoven, A.; Surf. Sci. 2000, 158, 362.
7. Vickerman, J. C.; Briggs, D.; TOF-SIMS Surface Analysis by Mass Spectrometry; Surface Spectra Ltd: Chinchester; IM Publications, 2001.
8. Rading, D.; Liebing, V.; Becker, G.; Fuchs, H.; Benninghoven, A.; J. Vac. Sci. Technol., A 1998, 16, 3449.
9. Gilmore, I. S.; Seah M. P.; Appl. Surf. Sci. 2002, 187, 89.
10. Pacholski, M. L.; Winograd N.; Chem. Rev. 1999, 99, 2977.
11. Burns, A. R.; Stechel, E. B.; Jennison, D. R.; Desorption Induced by Electronic Transition, DIET V; Spriger Series in Surface Sciences; Springer-Verlag: Berlin, Heidelberg, 1993 e edições posteriores.
12. Ishikawa, K.; Yoshimura, M.; Ueda, K.; Sakai, Y.; Rev. Sci. Instrum. 1997, 68, 4103.
13. Ishikawa, K.; Ueda, K.; Yoshimura, M.; Surf. Sci. 1999, 435, 244.
14. Ueda, K.; Ishikawa, K.; Ogai, K.; Surf. Sci. 2001, 493, 138.
15. Wollersheim, O.; Zumaqué, H.; Hormes, J.; Kadereit, D.; Langen, J.; Haubling, L.; Hoessel, P.; Hoffmann, G.; Nucl. Instrum. Methods Phys. Res., Sect. B 1995, 97, 273.
16. Zhang, Y.; Katoh, T.; Jpn. J. Appl. Phys. 1996, L186, 35.
17. Ehrfeld, W.; Münchmeyer, D.; Nucl. Instrum. Methods Phys. Res., Sect. A 1991, 303, 523.
18. Rocco, M. L. M.; Weibel, D. E.; Pontes, F. C.; Pinho, R. R.; Faraudo, G. S.; de Souza, G. G. B.; Polym. Degrad. Stab. 2003, 80, 263.
19. Maciel, J. B.; Morikawa, E.; Souza, G. G. B. de; Synchrotron Radiation Instrumentation, National Conference, AIP Conf. Proc. 417, 1997.
20. Dahl, D. A.; Simian 3D Version 6.0 User's Manual, Idaho National Engineering Laboratory, Ion Source Software, 1995.
21. Rocco, M. L. M.; Souza, G. G. B. de; Weibel, D. E.; Rev. Sci. Instrum. 2001, 72, 2827.
22. Cardoso, A. S.; Pontes, F. C.; Souza, G. G. B. de; Mundim, M. S. P.; Quim. Nova 2001, 24, 315.
23. Tinone, M. C. K.; Tanaka, K.; Maruyama, J.; Ueno, N.; Imamura, M.; Matsubayashi, N.; J. Chem. Phys. 1994, 100, 5988.
24. Madey, T. E.; Ramaker, D. E.; Stockbauer, R.; Annu. Rev. Phys. Chem. 1984, 55, 215.
25. Tanaka, K.; Tinone, M. C. K.; Ikeura, H.; Sekiguchi, T.; Sekitani, T.; Rev. Sci. Instrum. 1995, 66, 1474.
26. Ueno, N.; Tanaka, K.; Jpn. J. Appl. Phys. 1997, 36, 7605.
27. Fujii, K.; Tomimoto, H.; Isshiki, K.; Tooyama, M.; Sekitani, T.; Tanaka, K.; Jpn. J. Appl. Phys. 1999, 38 (Suppl. 1), 321.
28. Fujii, K.; Taga, D.; Nakashima, Y.; Waki, S.; Sardar, S. A.; Yasui, Y.; Wada, S.-i.; Sekitani, T.; Tanaka, K.; Nucl. Instrum. Methods Phys. Res., Sect. A 2001, 467, 1509.