A Model for the Quartz Crystal Microbalance Frequency Response to Wetting Characteristics of Corrugated Surfaces

Analytical Chemistry

Volumn 76, Issue 3, 2004, Pages 796-804

  Theisen, Lisa A ^a   Martin, Stephen J ^a   Hillman, A Robert ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b UNIVERSITY OF LEICESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT ANGLE; CRYSTALS; HYDROPHOBICITY; QUARTZ; SURFACE ROUGHNESS; SURFACE TENSION; WETTING;

LIQUID ENTRAINMENT; QUARTZ CRYSTAL MICROBALANCE;

RESONATORS;

ARTICLE; CALCULATION; COMPRESSION; DENSITY; DISPERSION; GAS; HYDROPHOBICITY; LIQUID; MATHEMATICAL MODEL; PARAMETER; PERIODICITY; QUARTZ CRYSTAL MICROBALANCE; SHEAR STRESS; SURFACE PROPERTY; SURFACE TENSION; TECHNIQUE; VISCOSITY; WATER ABSORPTION; WETTABILITY;

EID: 0842283939     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac034777x     Document Type: Article

References (32)

1. Ballantine, D. S.; White, R. M.; Martin, S. J.; Ricco, A. J.; Zellers, E. T.; Frye, G. C.; Wohltjen, H. Acoustic Wave Sensors: Theory, Design, and Physico-Chemical Applications; Academic Press: San Diego, CA, 1997.
2. Rodahl, M., Kasemo, B. Sens. Actuators, A 1996, 54, 448-456.
3. Daikhin, L.; Urbakh, M. Langmuir 1996, 12, 6354-6360.
4. Bandey, H.; Martin, S.; Cernosek, R.; Hillman, A. Anal. Chem. 1999, 71, 2205-2214.
5. Ferrante, F.; Kipling, A. L.; Thompson, M. J. Appl. Phys. 1994, 76, 3448-3462.
6. Schumacher, R. Angew. Chem., Int. Ed. Engl. 1990, 29, 329-343.
7. Martin, S. J.; Granstaff, V. E.; Frye, G. C. Anal. Chem. 1991, 63, 2272-2281.
8. Kanazawa, K. K.; Gordon, J. G. Anal. Chem. 1985, 57, 1770-1771.
9. Yang, M.; Thompson, M. Langmuir 1993, 9, 1990-1994.
10. Yang, M. S.; Thompson, M.; Duncan-Hewitt, W. C. Langmuir 1993, 9, 802-811.
11. Martin, S. J.; Frye, G. C.; Ricco, A. J.; Senturia, S. D. Anal. Chem. 1993, 65, 2910-2922.
12. Palasantzas, G.; de Hosson, J. T. M. Acta Mater. 2001, 49, 3533-3538.
13. Nakae, H.; Inui, R.; Hirata, Y.; Saito, H. Acta Mater. 1998, 46, 2313-2318.
14. Quere, D. Physica A 2002, 313, 32-46.
15. Wapner, P.; Hoffman, W. Langmuir 2002, 18, 1225-1230.
16. Reed, C. E.; Kanazawa, K. K.; Kaufman, J. H. J. Appl. Phys. 1990, 68, 1993-2001.
17. Urbakh, M.; Daikhin, L. Langmuir 1994, 10, 2836-2841.
18. Urbakh, M.; Daikhin, L. Phys. Rev. B 1994, 49, 4866-4870.
19. Urbakh, M.; Daikhin, L. Colloids Surf., A 1998, 134, 75-84.
20. Daikhin, L.; Gileadi, E.; Katz, G.; Tsionsky, V.; Urbakh, M.; Zagidulin, D. Anal. Chem. 2002, 74, 554-561.
21. Adamson, A. W. Physical Chemistry of Surfaces, 5th ed.; Wiley: New York, 1990.
22. Polishing with spherical abrasive particles produces surface channels that we approximate as sinusoidal with depth 2A equal to full width at half-height (Λ/2). This results in a fixed relationship between amplitude A and periodicity Λ: A/Λ = 1/4.
23. Sauerbrey, G. Z. Phys. 1959, 155, 206-222.
24. Lubetkin, S. D. Chem. Soc. Rev. 1995, 24, 243-250.
25. Lubetkin, S. D. Langmuir 2003, 19, 2575-2587.
26. Peng, M.; Kurokawa, T.; Gong, J.; Osada, Y.; Zheng, Q. J. Phys. Chem. B 2002, 106, 3073-3081.
27. Jones, S. F.; Evans, G. M.; Galvin, K. P. Adv. Colloid Interface Sci. 1999, 80, 27-50.
28. Bankoff, S. G. AICHE J. 1958, 4, 24-26.
29. Rejmer, K.; Dietrich, S.; Napiorkowski, M. Phys. Rev. E 1999, 60, 4027-4042.
30. 1 0.007, giving an estimate of the error arising from this assumption.
31. Rudich, Y.; Benjamin, I.; Naaman, R.; Thomas, E.; Trakhtenberg, S.; Ussyshkin, R. J Phys. Chem. A 2000, 104, 5238-5245.
32. Stalgren, J.; Eriksson, J.; Boschkova, K. J. Colloid Interface Sci. 2002, 253, 190-195.