Modeling the responses of thickness-shear mode resonators under various loading conditions

Analytical Chemistry

Volumn 71, Issue 11, 1999, Pages 2205-2214

  Bandey, Helen L ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL RESONATORS; DENSITY OF LIQUIDS; ELASTIC MODULI; ELECTROCHEMISTRY; INTERFACES (MATERIALS); MATHEMATICAL MODELS; VISCOSITY OF LIQUIDS;

QUARTZ CRYSTAL MICROBALANCE; THICKNESS SHEAR MODE RESONATORS;

ANALYTIC EQUIPMENT;

POLYMER; SILICON DIOXIDE;

ARTICLE; CRYSTAL; DENSITY; ELECTRIC FIELD; ELECTROCHEMISTRY; FILM; GAS; GRAVIMETRY; LIQUID; MATHEMATICAL ANALYSIS; MECHANICAL STRESS; PHYSICAL MODEL; PIEZOELECTRICITY; RIGIDITY; SHEAR STRESS; THICKNESS; VISCOELASTICITY; VISCOSITY;

EID: 0033151990     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac981272b     Document Type: Article

References (2)

1. Interactions of Acoustic Waves with Thin Films and Interfaces; Faraday Discussions 107; Royal Society of Chemistry: London, 1997.
2. Sauerbrey, G. Z. Phys. 1959, 155, 206-222.