Quantitative Phase Analysis Using the Rietveld Method - Estimates of Possible Problems Based on Two Interlaboratory Comparisons

Materials Science Forum

Volumn 443-444, Issue , 2004, Pages 45-50

  Peplinski, B ^a   Kleeberg, R ^b   Bergmann, J ^c   Wenzel, J ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b TU BERGAKADEMIE FREIBERG   (Germany)

^c NONE   (Germany)

Author keywords

Interlaboratory Comparison; Quantitative Phase Analysis QPA; Reference Materials; Refinement Strategy; Rietveld Analysis; Round Robin; Silicon Nitride

Indexed keywords

CHEMICAL LABORATORIES; DATA ACQUISITION; DATA HANDLING; DATA STRUCTURES; DECOMPOSITION; POWDERS; PROJECT MANAGEMENT; TIME MEASUREMENT; X RAY DIFFRACTION;

INTERLABORATORY COMPARISONS; QUANTITATIVE PHASE ANALYSIS (QPA); REFERENCE MATERIALS; REFINEMENT STRATEGY; RIETVELD ANALYSIS; ROUND ROBIN;

SILICON NITRIDE;

EID: 0842283348     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.443-444.45     Document Type: Conference Paper

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