Crystal structure refinement of α-Si3N4 using synchrotron radiation powder diffraction data: Unbiased refinement strategy

Journal of Applied Crystallography

Volumn 33, Issue 1, 2000, Pages 95-102

  Toraya, H ^a  

^a NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA SILICON NITRIDE; SILICON DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; CRYSTAL STRUCTURE; INTERMETHOD COMPARISON; MATHEMATICAL ANALYSIS; PARAMETER; PHOTON; STATISTICS; SYNCHROTRON; WEIGHT; X RAY POWDER DIFFRACTION;

EID: 0034480468     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899013060     Document Type: Article

References (7)

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3. Caglioti, G., Paoletti, A. & Ricci, F. P. (1958). Nucl. Iustrum. 3, 223-228.
4. Vitervo, D. (1994). Fundamentals of Crystallography, edited by C. Giacovazzo, pp. 365-375. Oxford University Press.
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7. Young, R. A. (1995). The Rietveld Method, pp. 1-38. Oxford University Press.