Interlaboratory comparison (round robin) of the application of the rietveld method to quantitative phase analysis by X-ray and neutron diffraction

Materials Science Forum

Volumn 378-381, Issue I, 2001, Pages 124-129

  Peplinski, B ^a   Schultze, D ^a   Wenzel, J ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

Author keywords

Interlaboratory comparison; Quality assurance; Quantitative phase analysis; Reference materials; Rietveld analysis; Round robin; Silicon nitride; Statistical tests

Indexed keywords

COMPUTER APPLICATIONS; COMPUTER PROGRAMMING LANGUAGES; QUALITY ASSURANCE; SILICON NITRIDE; STATISTICAL METHODS; X RAY POWDER DIFFRACTION;

INTERLABORATORY COMPARISON; QUANTITATIVE PHASE ANALYSIS; REFERENCE MATERIALS; RIETVELD ANALYSIS;

MATERIALS SCIENCE;

EID: 0035190184     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (4)