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Applied Physics A: Materials Science and Processing

Volumn 78, Issue 3, 2004, Pages 401-405

Interface injection-limited carrier-transport properties of Alq3

(4) Uddin, A a Lee, C B a Hu, X a Wong, T K S b

a NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

b NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CATHODES; CURRENT DENSITY; CURRENT VOLTAGE CHARACTERISTICS; INTERFACES (MATERIALS); SEMICONDUCTING ORGANIC COMPOUNDS; THICKNESS MEASUREMENT; TRANSPORT PROPERTIES;

CARRIER INJECTION PROCESSES; CHARGE HOPPING; HYDROXYQUINOLINE ALUMINUM;

ALUMINUM COMPOUNDS;

EID: 0742303565 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s00339-003-2188-3 Document Type: Article

Times cited : (16)

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