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Volumn 74, Issue 3 I, 2003, Pages 1274-1277

Highly efficient time-of-flight spectrometer for studying low-energy secondary emission from dielectrics: Secondary-electron emission from LiF film

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; DIELECTRIC MATERIALS; ELECTRIC CURRENTS; ELECTRONS; SPECTROMETERS;

EID: 0037350138     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1537044     Document Type: Article
Times cited : (31)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.