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Volumn 74, Issue 3 I, 2003, Pages 1274-1277
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Highly efficient time-of-flight spectrometer for studying low-energy secondary emission from dielectrics: Secondary-electron emission from LiF film
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALS;
DIELECTRIC MATERIALS;
ELECTRIC CURRENTS;
ELECTRONS;
SPECTROMETERS;
TIME-OF-FLIGHT SPECTROMETERS;
SECONDARY EMISSION;
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EID: 0037350138
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1537044 Document Type: Article |
Times cited : (31)
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References (19)
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