Surface-plasmon-assisted secondary-electron emission from an atomically flat LiF(001) surface

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 164, Issue , 2000, Pages 933-937

  Kimura, Kenji ^a   Andou, Gou ^a   Nakajima, Kaoru ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LITHIUM COMPOUNDS; PROTONS; TIN ALLOYS;

LITHIUM FLOURIDE; SURFACE PLASMON;

SECONDARY EMISSION;

EID: 0033741554     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)01126-X     Document Type: Article

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