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Volumn , Issue , 2003, Pages 760-764

Static Verification of Test Vectors for IR Drop Failure

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; CROSSTALK; DELAY CIRCUITS; ELECTRIC POTENTIAL; ELECTRONIC EQUIPMENT TESTING; ERROR ANALYSIS; MICROPROCESSOR CHIPS; PROBLEM SOLVING; SWITCHING; VECTORS;

EID: 0348040097     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iccad.2003.159762     Document Type: Conference Paper
Times cited : (21)

References (15)
  • 10
    • 0030672649 scopus 로고    scopus 로고
    • Vector generation for maximum instantaneous current through supply lines for CMOS circuits
    • A. Krstic, K. T. Cheng "Vector generation for maximum instantaneous current through supply lines for CMOS circuits", Proceedings of IEEE design Automation conference, 1997
    • (1997) Proceedings of IEEE Design Automation Conference
    • Krstic, A.1    Cheng, K.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.