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Volumn , Issue , 2003, Pages 760-764
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Static Verification of Test Vectors for IR Drop Failure
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Author keywords
[No Author keywords available]
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Indexed keywords
ALGORITHMS;
COMPUTER SIMULATION;
CROSSTALK;
DELAY CIRCUITS;
ELECTRIC POTENTIAL;
ELECTRONIC EQUIPMENT TESTING;
ERROR ANALYSIS;
MICROPROCESSOR CHIPS;
PROBLEM SOLVING;
SWITCHING;
VECTORS;
PROCESS VOLTAGE TEMPERATURE (PVT);
TEST VECTOR GENERATION;
TRANSITION DELAY TESTS;
LOGIC GATES;
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EID: 0348040097
PISSN: 10923152
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/iccad.2003.159762 Document Type: Conference Paper |
Times cited : (21)
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References (15)
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