Surface phase transitions upon reduction of epitaxial WO3(1 0 0) thin films

Thin Solid Films

Volumn 446, Issue 2, 2004, Pages 238-247

  Li, M ^a   Altman, E I ^a   Posadas, A ^a   Ahn, C H ^a  

^a Yale University   (United States)

Author keywords

Epitaxial oxide films; Scanning tunneling microscopy; Surface phase transitions; Surface reconstructions; Tungsten oxide

Indexed keywords

ANNEALING; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; STOICHIOMETRY; SURFACE STRUCTURE; TUNGSTEN COMPOUNDS;

SURFACE PHASE TRANSITIONS; SURFACE RECONSTRUCTIONS;

THIN FILMS;

EID: 0348011345     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.002     Document Type: Article

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