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Volumn 83, Issue 20, 2003, Pages 4193-4195

Intrinsic compensation of silicon-doped AlGaN

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CARRIER CONCENTRATION; COMPOSITION; ELECTRIC VARIABLES MEASUREMENT; ELECTRON TRANSITIONS; ELECTRONIC DENSITY OF STATES; ENERGY GAP; HALL EFFECT; IONIZATION; SCHOTTKY BARRIER DIODES; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING;

EID: 0347885305     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1628396     Document Type: Article
Times cited : (25)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.