-
1
-
-
3142597487
-
Vacuum methods in electron microscopy
-
Portland Press, London
-
Bigelow WC: Vacuum methods in electron microscopy. In Practical Methods in Electron Microscopy, 15, Portland Press, London, (1994) 88-91
-
(1994)
Practical Methods in Electron Microscopy
, vol.15
, pp. 88-91
-
-
Bigelow, W.C.1
-
2
-
-
33947711876
-
Foundations of environmental scanning electron microscopy
-
Danilatos GD: Foundations of environmental scanning electron microscopy. Adv Electron Electr Phys 71, 109-250 (1988)
-
(1988)
Adv Electron Electr Phys
, vol.71
, pp. 109-250
-
-
Danilatos, G.D.1
-
3
-
-
0031475445
-
Atomic clusters in ultrahigh intensity light fields
-
Ditmire T: Atomic clusters in ultrahigh intensity light fields. Contemp Phys, 38, 5, 315-328 (1997)
-
(1997)
Contemp Phys
, vol.38
, Issue.5
, pp. 315-328
-
-
Ditmire, T.1
-
4
-
-
0000621557
-
High-vacuum versus "environmental" electron beam deposition
-
Folch A, Servat J, Esteve J, Tejada J, Seco M: High-vacuum versus "environmental" electron beam deposition. J Vac Sci Technol B 14, 4, 2609-2614 (1996)
-
(1996)
J Vac Sci Technol
, vol.B14
, Issue.4
, pp. 2609-2614
-
-
Folch, A.1
Servat, J.2
Esteve, J.3
Tejada, J.4
Seco, M.5
-
5
-
-
0033371081
-
Some theoretical considerations on x-ray microanalysis in the environmental or variable pressure scanning electron microscope
-
Gauvin R: Some theoretical considerations on x-ray microanalysis in the environmental or variable pressure scanning electron microscope. Scanning, 21, 6, 388-393 (1999)
-
(1999)
Scanning
, vol.21
, Issue.6
, pp. 388-393
-
-
Gauvin, R.1
-
6
-
-
0036329523
-
A method to measure the effective gas path length in the environmental or variable pressure scanning electron microscope
-
Gauvin R, Griffin B, Nockolds C, Phillips M, Joy DC: A method to measure the effective gas path length in the environmental or variable pressure scanning electron microscope. Scanning, 24, 171-174 (2002)
-
(2002)
Scanning
, vol.24
, pp. 171-174
-
-
Gauvin, R.1
Griffin, B.2
Nockolds, C.3
Phillips, M.4
Joy, D.C.5
-
7
-
-
23044518740
-
On the measurement of total elastic cross-sections in the ESEM or VPSEM using x-ray microanalysis
-
Gauvin R, Joy DC: On the measurement of total elastic cross-sections in the ESEM or VPSEM using x-ray microanalysis. Microsc Microanal 6 (Suppl 2) S788-S789 (2000)
-
(2000)
Microsc Microanal
, vol.6
, Issue.SUPPL. 2
-
-
Gauvin, R.1
Joy, D.C.2
-
8
-
-
0003539132
-
-
Plenum Press, New York
-
Goldstein JI, Newbury DE, Echlin P, Joy DC, Romig AD Jr., Lyman CE, Fiori C, Lifshin E: Scanning Electron Microscopy and X-ray Microanalysis. Plenum Press, New York (1992) 70
-
(1992)
Scanning Electron Microscopy and X-ray Microanalysis
, pp. 70
-
-
Goldstein, J.I.1
Newbury, D.E.2
Echlin, P.3
Joy, D.C.4
Romig Jr., A.D.5
Lyman, C.E.6
Fiori, C.7
Lifshin, E.8
-
10
-
-
0001854223
-
Modeling the electron-gas interaction in low vacuum SEMs
-
Joy DC: Modeling the electron-gas interaction in low vacuum SEMs. Microsc Microanal, 468-469 (1996)
-
(1996)
Microsc Microanal
, pp. 468-469
-
-
Joy, D.C.1
-
11
-
-
0006373760
-
Principle and application of the variable pressure SEM
-
Mathieu C: Principle and application of the variable pressure SEM. Microsc Anal, 13, 13-14 (1996)
-
(1996)
Microsc Anal
, vol.13
, pp. 13-14
-
-
Mathieu, C.1
-
12
-
-
0037688998
-
The beam-gas and signal-gas interactions in the variable pressure scanning electron microscope
-
Mathieu C: The beam-gas and signal-gas interactions in the variable pressure scanning electron microscope. Scan Microsc, 13, 1, 23-41 (1999)
-
(1999)
Scan Microsc
, vol.13
, Issue.1
, pp. 23-41
-
-
Mathieu, C.1
-
13
-
-
0001244375
-
Electron beam induced selective etching and deposition technology
-
Matsui S, Lchihashi T, Mito M: Electron beam induced selective etching and deposition technology. J Vac Sci Technol B7 (A5), 1182-1190(1989)
-
(1989)
J Vac Sci Technol
, vol.B7
, Issue.A5
, pp. 1182-1190
-
-
Matsui, S.1
Lchihashi, T.2
Mito, M.3
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