Infrared optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films using spectroscopic ellipsometry

Journal of Physics D: Applied Physics

Volumn 35, Issue 24, 2002, Pages 3221-3224

  Hu, Zhigao ^a   Wang, Genshui ^a   Huang, Zhiming ^a   Meng, Xiangjian ^a   Chu, Junhao ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; ELLIPSOMETRY; FILM GROWTH; INFRARED RADIATION; PERMITTIVITY; POLYCRYSTALLINE MATERIALS; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS; SUBSTRATES; X RAY DIFFRACTION;

WAVE NUMBERS;

FERROELECTRIC THIN FILMS;

EID: 0037153752     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/35/24/311     Document Type: Article

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