Diffraction topography using white X-ray beams with low effective divergence

Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences

Volumn 357, Issue 1761, 1999, Pages 2741-2754

  Baruchel, José ^a   Cloetens, Peter ^a   Härtwig, Jürgen ^a   Schlenker, Michel ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

Bragg diffraction imaging; Crystallographic phase determination; Optical coherence; Synchrotron radiation; X ray imaging; X ray topography

Indexed keywords

EID: 0347138182     PISSN: 1364503X     EISSN: None     Source Type: Journal    
DOI: 10.1098/rsta.1999.0463     Document Type: Article

References (26)

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