Phase retrieval by combined bragg and fresnel X-Ray diffraction imaging

Physical Review Letters

Volumn 81, Issue 16, 1998, Pages 3435-3438

  Rejmankova Pernot P ^a   Cloetens, P ^a,c   Baruchel, J ^a   Guigay, J P ^a,d   Moretti, P ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITÉ LYON 1   (France)

^c UNIVERSITY OF ANTWERP   (Belgium)

^d LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; COMPUTER SIMULATION; ELECTROMAGNETIC WAVE DIFFRACTION; LITHIUM NIOBATE; NONLINEAR OPTICS; NUMERICAL METHODS; OPTICAL TRANSFER FUNCTION; X RAY DIFFRACTION ANALYSIS;

BRAGG DIFFRACTION IMAGES; FERROELECTRIC DOMAINS; FRESNEL DIFFRACTION; PHASE RETRIEVAL; TALBOT EFFECT;

FERROELECTRIC MATERIALS;

EID: 0032547659     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.81.3435     Document Type: Article

References (27)

1. A. G. Klein and G. I. Opat: Phys. Rev. Lett., 37, 238 (1976).
2. A. Snigirev, et al: Rev. Sci. Instrum., 66, 5486 (1995).
3. P. Cloetens, et al: J. Phys. D, 29, 133 (1996).
4. J. A. Armstrong, N. Bloemberger, J. Ducuing, and P. S. Pershan: Phys. Rev., 127, 1918 (1962).
5. M. Yamada, N. Nada, M. Saitoh, and K. Watanabe: Appl. Phys. Lett., 62, 435 (1993).
6. L. E. Myers, et al: J. Opt. Soc. Am. B, 12, 2102 (1995).
7. Shi-ning Zhu, et al: J. Phys. D, 28, 76 (1996).
8. K. Nassau, H. J. Levinstein, and G. M. Loiacono: Appl. Phys. Lett., 6, 228 (1965).
9. B. J. Wicks and M. H. Lewis: Phys. Status. Solidi, 26, 571 (1968).
10. M. Houe and P. D. Townsend: Appl. Phys. Lett., 66, 2667 (1995).
11. V. D. Kugel, G. Roseman, and D. Shur: J. Phys. D, 28, 2360 (1995).
12. C. A. Wallace: J. Appl. Crystallogr., 3, 546 (1970).
13. T. Vreeland, Jr. and V. S. Speriosu, in Application of X-ray Topographic Methods to Materials Science, S. Weissmann, F. Balibar, and J.-F. Petroff (Plenum Press, New York and London, 1984), p. 501.
14. Z. W. Hu, P. A. Thomas, and J. Webjörn: J. Appl. Crystallogr., 29, 279 (1996).
15. P. Rejmánková, et al: J. Appl. Crystallogr., 31, 106 (1998).
16. Z. W. Hu, et al: Nature (London), 392, 690 (1998).
17. M. Born and E. Wolf, Principle of Optics (Pergamon Press, Oxford, New York, 1980), 6th ed., p. 382.
18. J. Baruchel, in Neutron and Synchrotron Radiation for Condensed Matter Studies, J. Baruchel, J. L. Hodeau, M. S. Lehmann, J. R. Regnard, and C. Schlenker (Springer-Verlag, Berlin, 1993), Vol. I, p. 399.
19. A. Guinier, Théorie et Technique de la Radiocristallographie (Dunod, Paris, 1964), p. 327.
20. A. Soyer: J. Appl. Crystallogr., 28, 244 (1995).
21. H. F. Talbot: Philos. Mag., 9, 401 (1836).
22. J.-P. Guigay: Opt. Acta, 18, 677 (1971).
23. P. Cloetens, et al., Opt. Lett., 22, 1059 (1997).
24. J.-P. Guigay: Optik, 49, 121 (1977).
25. S. C. Abrahams and P. Marsh: Acta Crystallogr. Sect. B, 42, 61 (1986).
26. W. Coene, G. Janssen, J. Op de Beeck, and D. Van Dyck: Phys. Rev. Lett., 69, 3743 (1992).
27. K. Takahashi and M. Takagi: J. Phys. Soc. Jpn., 44, 1266 (1978).