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Volumn 11, Issue 6, 2003, Pages 624-631

Novel laser datum system for nanometric profilometry for large optical surfaces

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; CLOSED LOOP CONTROL SYSTEMS; CROSSTALK; HYSTERESIS; LASERS; MIRRORS; PHOTODIODES; SENSORS; SURFACE MEASUREMENT; TELESCOPES;

EID: 0347112776     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.11.000624     Document Type: Article
Times cited : (10)

References (15)
  • 2
    • 84894018647 scopus 로고    scopus 로고
    • National Physical Laboratory, NPL and the EURO50 telescope, http://www.npl.co.uk/length/dmet/euro50.html
    • NPL and the EURO50 Telescope
  • 4
    • 84894012966 scopus 로고    scopus 로고
    • The primary and secondary mirrors for the proposed Euro50 telescope
    • D.D.Walker et al., "The primary and secondary mirrors for the proposed Euro50 telescope," Design Study Report (2002).
    • (2002) Design Study Report
    • Walker, D.D.1
  • 6
    • 0022059627 scopus 로고
    • Calibration and use of optical straightedges in the metrology of precision machines
    • W.T.Estler, "Calibration and use of optical straightedges in the metrology of precision machines," Opt. Eng. 24, 372-379 (1985).
    • (1985) Opt. Eng. , vol.24 , pp. 372-379
    • Estler, W.T.1
  • 7
    • 0029516245 scopus 로고
    • Swing-arm profilometry of aspherics
    • Optical manufacturing and testing, V.J.Doherty and H.Stahl
    • D.S.Anderson, J.H.Burge, "Swing-arm Profilometry of Aspherics," in Optical manufacturing and testing, V.J.Doherty and H.Stahl, Proc. SPIE 2536, 169-179 (1995).
    • (1995) Proc. SPIE , vol.2536 , pp. 169-179
    • Anderson, D.S.1    Burge, J.H.2
  • 8
    • 79952535634 scopus 로고
    • Design of a long-trace surface profiler
    • Metrology: Figure and Finish, B.E.Truax
    • P.Z.Takacs, S.-N. Qian and J. Colbert, "Design of a long-trace surface profiler," in Metrology:Figure and Finish, B.E.Truax, Proc. SPIE 749, 59-64 (1987).
    • (1987) Proc. SPIE , vol.749 , pp. 59-64
    • Takacs, P.Z.1    Qian, S.-N.2    Colbert, J.3
  • 9
    • 84957512807 scopus 로고
    • Long trace profile measurements on cylindrical aspheres
    • Advances in Fabrication and Metrology for optics and large optics, J.B.Arnold and R.E.Parks
    • P.Z.Takacs, S.C.K. Feng, E. L. Church, S. -N. Qian, W. -M. Liu, "Long trace profile measurements on cylindrical aspheres," in Advances in Fabrication and Metrology for optics and large optics, J.B.Arnold and R.E.Parks, Proc. SPIE 966, 354-364 (1989).
    • (1989) Proc. SPIE , vol.966 , pp. 354-364
    • Takacs, P.Z.1    Feng, S.C.K.2    Church, E.L.3    Qian, S.-N.4    Liu, W.-M.5
  • 10
    • 0000637816 scopus 로고
    • The penta-prism LTP: A long-trace-profiler with stationary optical head and moving penta prism
    • S.-N. Qian, W.Jark, P. Z. Takacs, "The penta-prism LTP: A long-trace-profiler with stationary optical head and moving penta prism, " Rev.Sci.Instrum 66, 2562-2569 (1995).
    • (1995) Rev.Sci.Instrum , vol.66 , pp. 2562-2569
    • Qian, S.-N.1    Jark, W.2    Takacs, P.Z.3
  • 11
    • 0000616448 scopus 로고    scopus 로고
    • Significant improvements in long trace profiler measurement performance
    • Optics for High-brightness synchrotron radiation beamlinsell, L.E.Berman and J.R.Arthur.
    • P.Z.Takacs, "Significant Improvements in Long Trace Profiler Measurement Performance," in Optics for High-brightness synchrotron radiation beamlinsell, L.E.Berman and J.R.Arthur., Proc. SPIE 2856, 236-245 (1996).
    • (1996) Proc. SPIE , vol.2856 , pp. 236-245
    • Takacs, P.Z.1
  • 12
    • 0033888254 scopus 로고    scopus 로고
    • Precision calibration and systematic error reduction in the long trace profiler
    • S.Qian, G.Sostero, P.Z.Takacs, "Precision calibration and systematic error reduction in the long trace profiler, " Opt. Eng. 39, 304-310 (2000)
    • (2000) Opt. Eng. , vol.39 , pp. 304-310
    • Qian, S.1    Sostero, G.2    Takacs, P.Z.3
  • 13
    • 0028383040 scopus 로고
    • Non-contacting straightness measurementto nanometer accuracy
    • M. Virdee, "Non-contacting straightness measurementto nanometer accuracy," Int. J. Mach. Tools Manufact 35, 157-164 (1995).
    • (1995) Int. J. Mach. Tools Manufact , vol.35 , pp. 157-164
    • Virdee, M.1
  • 14
    • 0000143167 scopus 로고    scopus 로고
    • High-resolution multidimensional displacement monitoring system
    • K. S. Lee Neville, Yimin Cai, Ajay Joneja, "High-resolution multidimensional displacement monitoring system," Opt Eng. 36, 2287-2293 (1997).
    • (1997) Opt Eng. , vol.36 , pp. 2287-2293
    • Neville, K.S.L.1    Cai, Y.2    Joneja, A.3
  • 15
    • 0010667142 scopus 로고    scopus 로고
    • Ultra-high-resolution optical monitoring System using a noise cancellation technique
    • K. S. Lee Neville, Yimin Cai, S. F. Wong Alfred, Ajay Joneja, "Ultra-high-resolution optical monitoring System using a noise cancellation technique," Opt. Eng. 36, 3353-3359 (1997).
    • (1997) Opt. Eng. , vol.36 , pp. 3353-3359
    • Neville, K.S.L.1    Cai, Y.2    Alfred, S.F.W.3    Joneja, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.