Experimental verification of prediction method for electromigration failure of polycrystalline lines

Journal of Applied Physics

Volumn 87, Issue 6, 2000, Pages 2785-2791

  Sasagawa, Kazuhiko ^a   Naito, Kazushi ^b   Kimura, Hiroki ^b   Saka, Masumi ^b   Abé, Hiroyuki ^b  

^a HIROSAKI UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0347055370     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372257     Document Type: Article

References (6)

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2. J. W. McPherson, Proceedings of the IEEE International Reliability Physics Symposium. 1986, p. 12.
3. K. Sasagawa, N. Nakamura, M. Saka, and H. Abé, Trans. ASME, J. Elect. Pack. 120, 360 (1998).
4. K. Sasagawa, K. Naito, M. Saka, and H. Abé, J. Appl. Phys. 86, 6043 (1999).
5. R. Kirchheim and U. Kaeber, J. Appl. Phys. 70, 172 (1991).
6. L. F. Mondolfo, Aluminum Alloys: Structure and Properties (Butterworths, London, 1976), p. 59.