A new approach to calculate atomic flux divergence by electromigration

Journal of Electronic Packaging, Transactions of the ASME

Volumn 120, Issue 4, 1998, Pages 360-366

  Sasagawa, K ^a   Nakamura, N ^a   Saka, M ^a   Abe H ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC CURRENT DISTRIBUTION; ELECTROMIGRATION; POLYCRYSTALLINE MATERIALS; TEMPERATURE DISTRIBUTION;

ATOMIC FLUX DIVERGENCE;

ELECTRONICS PACKAGING;

EID: 0032292876     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2792647     Document Type: Article

References (12)

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