High-pressure phase transformation of silicon nitride

Applied Physics Letters

Volumn 83, Issue 23, 2003, Pages 4740-4742

  Patten, John ^a,d   Fesperman, Ronnie ^a   Kumar, Satya ^a   McSpadden, Sam ^b   Qu, Jun ^b   Lance, Michael ^b   Nemanich, Robert ^c   Huening, Jennifer ^c  

^a UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c NORTH CAROLINA STATE UNIVERSITY   (United States)

^d WESTERN MICHIGAN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK MATERIALS; METALLIC PHASES;

ACOUSTIC MICROSCOPES; CERAMIC MATERIALS; COMPRESSIVE STRESS; FRACTURE MECHANICS; HIGH PRESSURE EFFECTS; LOW TEMPERATURE EFFECTS; OPTICAL MICROSCOPY; PHASE TRANSITIONS; PLASTIC DEFORMATION; PLASTICITY; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; STRUCTURE (COMPOSITION); SUPERCONDUCTING TRANSITION TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET SPECTROSCOPY;

SILICON NITRIDE;

EID: 0346936434     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1632031     Document Type: Article

References (21)

1. F. Wakai, Y. Komada, S. Sakaguchi, N. Murayama, and K. Niihara, Nature (London) 344, 421 (1990).
2. T. Kumbera, H. Cherukuri, J. Patten, C. Brand, and T. Marusich, Mach. Sci. Technol. 5, 341 (2001).
3. F. Rosei and P. Raiteri, Appl. Surf. Sci. 195, 16 (2002).
4. T. Sekine, H. He, T. Kobayashi, M. Zhang, and F. Xu, Appl. Phys. Lett. 76, 3706 (2000).
5. G. Ramachandran, P. F. McMillan, and S. K. Deb, J. Phys.: Condens. Matter 12, 4013 (2000).
6. M. Zhang, H. M. Hobgood, J. L. Demenet, and P. Pirouz, J. Mater. Res. 18, 1087 (2003).
7. J. J. Gilman, Philos. Mag. B 67, 207 (1993).
8. T. Juliano, Y. Gogotsi, and V. Domnich, J. Mater. Res. 18, 1192 (2003).
9. V. Domnich, Y. Gogotsi, M. Trenary, and T. Tanaka, Appl. Phys. Lett. 81, 3783 (2002).
10. Y. Gogotsi, A. Kailer, and K. G. Nickel, Nature (London) 401, 663 (1999).
11. J. Patten, Advances in Abrasive Technology III (Japan Society of Abrasive Technology, Tokyo, 2000), p. 87.
12. C. Ullner, J. Beckmann, and R. Morrell, J. Eur. Ceram. Soc. 22, 1183 (2002).
13. The hardness of the test material is 22 GPa.
14. S. Ogata, N. Hirosaki, C. Kocer, and Y Shibutani, J. Mater. Res. 18, 1168 (2003).
15. J. Morris, D. Callahan, J. Kulik, J. Patten, and R. Scattergood, J. Am. Ceram. Soc. 78, 2015 (1995).
16. This acoustic microscope and some of the micro-Raman research was sponsored by the Assistant Secretary for Energy Efficiency and Renewable Energy, Office of Freedom Car and Vehicle Technologies, as part of the High Temperature Materials Laboratory User Program, Oak Ridge National Laboratory, managed by UT Battelle, LLC, for the US Department of Energy under Contract No. DE-AC05-00OR22725.
17. Transmission electron microscope (TEM) analysis of these same chips, Fig. 3, indicates a totally amorphous structure with none of the original or starting crystalline phase.
18. Y. V. Milman, S. I. Chugunova, and I. Timofeeva, Int. J. Impact Eng. 26, 533 (2001).
19. M. Yoshida and A. Onodera, Phys. Rev. B 48, 10587 (1993).
20. J. Gilman, Science 261, 1436 (1993).
21. A. Mujica, A. Rubio, A. Munroz, and R. J. Needs, Rev. Mod. Phys. 75, 863 (2003).