Transition from brittle fracture to ductile behavior in 4H-SiC

Journal of Materials Research

Volumn 18, Issue 5, 2003, Pages 1087-1095

  Zhang, Ming ^a   Hobgood, H M ^b   Demenet, J L ^c   Pirouz, P ^a  

^a Case Western Reserve University   (United States)

^b Arkansas Power Electronics International Inc   (United States)

^c CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BRITTLE FRACTURE; DUCTILITY; STRAIN RATE; SUPERCONDUCTING TRANSITION TEMPERATURE; YIELD STRESS;

BRITTLE-TO-DUCTILE TRANSITION (BDT);

SILICON CARBIDE;

EID: 0038681575     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2003.0150     Document Type: Article

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