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Volumn 261, Issue 2-3, 2004, Pages 404-410
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Mask interference effect in a densely arrayed waveguide fabricated by using narrow-stripe selective MOVPE
a
NEC CORPORATION
(Japan)
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Author keywords
A3. Metalorganic vapor phase epitaxy; A3. Selective epitaxy; B2. Semiconducting quaternary alloys
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Indexed keywords
COMPOSITION;
COMPUTER SIMULATION;
DISTRIBUTED FEEDBACK LASERS;
LIGHT INTERFERENCE;
MASKS;
OPTICAL WAVEGUIDES;
PHOTOLUMINESCENCE;
SEMICONDUCTING INDIUM GALLIUM ARSENIDE;
SEMICONDUCTOR LASERS;
SEMICONDUCTOR QUANTUM WELLS;
STRAIN;
MASK INTERFERENCE EFFECT;
SELECTIVE EPITAXY;
SEMICONDUCTING QUATERNARY ALLOYS;
METALLORGANIC VAPOR PHASE EPITAXY;
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EID: 0346785322
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2003.11.035 Document Type: Conference Paper |
Times cited : (7)
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References (7)
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