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Volumn 11, Issue 2, 2001, Pages 113-128

Optimising CVD Diamond Properties for Radiation Detection Applications: Growth Conditions, Defects, and Uniformity

Author keywords

CVD diamond; Defects; Growth; Radiation detectors

Indexed keywords


EID: 0346608547     PISSN: 13449931     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (38)
  • 21
    • 0032225270 scopus 로고    scopus 로고
    • The Scanning Microscopy End-station at the ESRF X-ray Microscopy Beamline
    • X-Ray Microfocusing: Applications and Techniques, edited by I. McNulty
    • R. Barrett, B. Kaulich, S. Oestreich and J. Susini: "The Scanning Microscopy End-station at the ESRF X-ray Microscopy Beamline" in X-Ray Microfocusing: Applications and Techniques, edited by I. McNulty, Proc. SPIE 3449 (1998).
    • (1998) Proc. SPIE , vol.3449
    • Barrett, R.1    Kaulich, B.2    Oestreich, S.3    Susini, J.4
  • 26
    • 0032662870 scopus 로고    scopus 로고
    • RD42 collaboration
    • W. Adam et al.: RD42 collaboration, Nucl. Inst. and Meth. A 434 (1999) 131.
    • (1999) Nucl. Inst. and Meth. A , vol.434 , pp. 131
    • Adam, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.