Determination of the fine-structure constant by a precise measurement of h/mn: The final result

Metrologia

Volumn 35, Issue 3, 1998, Pages 203-209

  Kruger E ^a   Nistler, W ^a   Weirauch, W ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG REFLECTION; FINE-STRUCTURE CONSTANTS; HIGH-FLUX REACTORS; TIME-OF-FLIGHT METHODS;

CRYSTAL STRUCTURE; SILICON; VELOCITY MEASUREMENT;

NEUTRON REFLECTION;

EID: 0032313675     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/35/3/9     Document Type: Article

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